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X-RAY DIFFRACTION
Materials and Methods page
3VVV
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 8.5
    Temperature 293.0
    Details 24% PEG4000, 0.1M Tris , pH 8.5, VAPOR DIFFUSION, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 36.61 α = 90
    b = 37.46 β = 90
    c = 90.4 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Radiation
    Diffraction Protocol Single Wavelength
     
    Diffraction Source
    Source Synchrotron
    Type ESRF BEAMLINE ID14-4
    Wavelength List 0.9395
    Site ESRF
    Beamline ID14-4
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.8
    Observed Criterion Sigma(I) 2.8
    Resolution(High) 1.35
    Resolution(Low) 26.18
    Number Reflections(All) 27862
    Number Reflections(Observed) 27862
    Percent Possible(Observed) 99.3
     
    High Resolution Shell Details
    Resolution(High) 1.35
    Resolution(Low) 1.42
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.559
    Mean I Over Sigma(Observed) 2.8
    Redundancy 3.5
    Number Unique Reflections(All) 4013
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.35
    Resolution(Low) 23.266
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 27807
    Number of Reflections(R-Free) 1361
    Percent Reflections(Observed) 99.02
    R-Factor(Observed) 0.1562
    R-Work 0.1546
    R-Free 0.1891
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 17.4049
    Anisotropic B[1][1] -2.417
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.291
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 2.708
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.35
    Shell Resolution(Low) 1.3983
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2645
    R-Factor(R-Work) 0.1992
    R-Factor(R-Free) 0.2328
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3983
    Shell Resolution(Low) 1.4542
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.1859
    R-Factor(R-Free) 0.2579
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4542
    Shell Resolution(Low) 1.5204
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.1686
    R-Factor(R-Free) 0.222
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5204
    Shell Resolution(Low) 1.6005
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2637
    R-Factor(R-Work) 0.138
    R-Factor(R-Free) 0.1952
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6005
    Shell Resolution(Low) 1.7008
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2637
    R-Factor(R-Work) 0.1266
    R-Factor(R-Free) 0.1741
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7008
    Shell Resolution(Low) 1.8321
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2644
    R-Factor(R-Work) 0.116
    R-Factor(R-Free) 0.1583
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8321
    Shell Resolution(Low) 2.0163
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 2610
    R-Factor(R-Work) 0.1293
    R-Factor(R-Free) 0.1639
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0163
    Shell Resolution(Low) 2.3079
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2658
    R-Factor(R-Work) 0.1446
    R-Factor(R-Free) 0.1882
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3079
    Shell Resolution(Low) 2.9068
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.1612
    R-Factor(R-Free) 0.1793
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9068
    Shell Resolution(Low) 23.2693
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2730
    R-Factor(R-Work) 0.1709
    R-Factor(R-Free) 0.2012
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 13.147
    f_plane_restr 0.008
    f_chiral_restr 0.106
    f_angle_d 1.272
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 905
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 178
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution SHARP
    Structure Refinement PHENIX (phenix.refine: dev_723)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction SCALA
    data collection Mosflm