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X-RAY DIFFRACTION
Materials and Methods page
3VV0
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    Temperature 277.0
    Details 0.1M Tris-HCl pH8.3-8.5, 28-30% PEG 6000, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 101.84 α = 90
    b = 39.13 β = 90
    c = 67.32 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Collection Date 2011-01-24
     
    Diffraction Radiation
    Monochromator Si 111
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SPRING-8 BEAMLINE BL32XU
    Site SPRING-8
    Beamline BL32XU
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2
    Resolution(Low) 50
    Number Reflections(Observed) 18855
    Percent Possible(Observed) 100.0
    B(Isotropic) From Wilson Plot 33.37
    Redundancy 7.0
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.07
    Percent Possible(All) 100.0
    Mean I Over Sigma(Observed) 2.8
    R-Sym I(Observed) 0.718
    Redundancy 6.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.001
    Resolution(Low) 28.176
    Cut-off Sigma(F) 1.33
    Number of Reflections(Observed) 18802
    Number of Reflections(R-Free) 1120
    Percent Reflections(Observed) 99.86
    R-Factor(Observed) 0.1888
    R-Work 0.1863
    R-Free 0.2318
     
    Temperature Factor Modeling
    Mean Isotropic B Value 47.0282
    Anisotropic B[1][1] 6.6979
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -5.9808
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.7171
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0012
    Shell Resolution(Low) 2.0922
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2126
    R-Factor(R-Work) 0.2357
    R-Factor(R-Free) 0.2917
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0922
    Shell Resolution(Low) 2.2025
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2153
    R-Factor(R-Work) 0.2121
    R-Factor(R-Free) 0.2645
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2025
    Shell Resolution(Low) 2.3404
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2184
    R-Factor(R-Work) 0.2002
    R-Factor(R-Free) 0.2488
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3404
    Shell Resolution(Low) 2.521
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2193
    R-Factor(R-Work) 0.1907
    R-Factor(R-Free) 0.2699
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.521
    Shell Resolution(Low) 2.7745
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2187
    R-Factor(R-Work) 0.1973
    R-Factor(R-Free) 0.233
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7745
    Shell Resolution(Low) 3.1756
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2206
    R-Factor(R-Work) 0.1967
    R-Factor(R-Free) 0.2695
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1756
    Shell Resolution(Low) 3.999
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2258
    R-Factor(R-Work) 0.1699
    R-Factor(R-Free) 0.2169
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.999
    Shell Resolution(Low) 28.1793
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2375
    R-Factor(R-Work) 0.1773
    R-Factor(R-Free) 0.1997
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.073
    f_dihedral_angle_d 14.435
    f_angle_d 1.084
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1848
    Nucleic Acid Atoms 0
    Heterogen Atoms 35
    Solvent Atoms 119
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER
    data collection HKL-2000