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X-RAY DIFFRACTION
Materials and Methods page
3VUZ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    Temperature 277.0
    Details 0.1M Tris-HCl pH8.3-8.5, 28-30% PEG 6000, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 101.81 α = 90
    b = 39.22 β = 90
    c = 67.04 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2010-10-16
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE AR-NW12A
    Site PHOTON FACTORY
    Beamline AR-NW12A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.5
    Resolution(Low) 50
    Number Reflections(Observed) 9883
    Percent Possible(Observed) 99.9
    B(Isotropic) From Wilson Plot 49.04
    Redundancy 7.1
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.59
    Percent Possible(All) 100.0
    Mean I Over Sigma(Observed) 3.2
    R-Sym I(Observed) 0.625
    Redundancy 7.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.5
    Resolution(Low) 28.19
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 9781
    Number of Reflections(R-Free) 560
    Percent Reflections(Observed) 99.89
    R-Factor(Observed) 0.1864
    R-Work 0.1829
    R-Free 0.2466
     
    Temperature Factor Modeling
    Mean Isotropic B Value 55.9884
    Anisotropic B[1][1] 2.2514
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -8.2579
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 6.0066
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5
    Shell Resolution(Low) 2.7514
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2224
    R-Factor(R-Work) 0.2711
    R-Factor(R-Free) 0.3658
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7514
    Shell Resolution(Low) 3.1491
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2266
    R-Factor(R-Work) 0.2155
    R-Factor(R-Free) 0.2912
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1491
    Shell Resolution(Low) 3.9658
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2310
    R-Factor(R-Work) 0.1781
    R-Factor(R-Free) 0.2496
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9658
    Shell Resolution(Low) 28.1915
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2421
    R-Factor(R-Work) 0.159
    R-Factor(R-Free) 0.2065
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.07
    f_dihedral_angle_d 16.554
    f_angle_d 1.111
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1916
    Nucleic Acid Atoms 0
    Heterogen Atoms 32
    Solvent Atoms 69
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER
    data collection HKL-2000