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X-RAY DIFFRACTION
Materials and Methods page
3VUW
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, hanging drop
    pH 8
    Temperature 293.0
    Details 10mM Tris-HCl, 150mM NaCl, pH 8.0, vapor diffusion, hanging drop, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 39.17 α = 70.08
    b = 51.99 β = 80.25
    c = 52.18 γ = 78.05
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX225HE
    Collection Date 2011-05-21
     
    Diffraction Radiation
    Monochromator Double-crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SPRING-8 BEAMLINE BL41XU
    Wavelength List 1.20000
    Site SPRING-8
    Beamline BL41XU
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.95
    Resolution(Low) 50
    Number Reflections(All) 26390
    Number Reflections(Observed) 26390
    Percent Possible(Observed) 96.2
    R Merge I(Observed) 0.057
    Redundancy 10.5
     
    High Resolution Shell Details
    Resolution(High) 1.95
    Resolution(Low) 1.98
    Percent Possible(All) 78.7
    R Merge I(Observed) 0.27
    Redundancy 10.4
    Number Unique Reflections(All) 1082
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.95
    Resolution(Low) 41.501
    Cut-off Sigma(F) 1.99
    Number of Reflections(all) 26354
    Number of Reflections(Observed) 26354
    Number of Reflections(R-Free) 1318
    Percent Reflections(Observed) 96.04
    R-Factor(All) 0.1803
    R-Factor(Observed) 0.1803
    R-Work 0.1782
    R-Free 0.2221
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 36.3715
    Anisotropic B[1][1] 5.0859
    Anisotropic B[1][2] 1.2496
    Anisotropic B[1][3] -0.7978
    Anisotropic B[2][2] -5.7236
    Anisotropic B[2][3] -7.2338
    Anisotropic B[3][3] 0.6377
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9501
    Shell Resolution(Low) 2.0282
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2503
    R-Factor(R-Work) 0.2202
    R-Factor(R-Free) 0.3057
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0282
    Shell Resolution(Low) 2.1205
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2771
    R-Factor(R-Work) 0.1962
    R-Factor(R-Free) 0.2714
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1205
    Shell Resolution(Low) 2.2323
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2784
    R-Factor(R-Work) 0.2035
    R-Factor(R-Free) 0.2617
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2323
    Shell Resolution(Low) 2.3721
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2823
    R-Factor(R-Work) 0.1875
    R-Factor(R-Free) 0.2718
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3721
    Shell Resolution(Low) 2.5552
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2782
    R-Factor(R-Work) 0.1828
    R-Factor(R-Free) 0.2291
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5552
    Shell Resolution(Low) 2.8123
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2845
    R-Factor(R-Work) 0.1799
    R-Factor(R-Free) 0.2298
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8123
    Shell Resolution(Low) 3.2191
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2836
    R-Factor(R-Work) 0.1896
    R-Factor(R-Free) 0.2251
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2191
    Shell Resolution(Low) 4.0552
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2859
    R-Factor(R-Work) 0.168
    R-Factor(R-Free) 0.2018
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0552
    Shell Resolution(Low) 41.5109
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2833
    R-Factor(R-Work) 0.1632
    R-Factor(R-Free) 0.1943
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 16.207
    f_plane_restr 0.005
    f_chiral_restr 0.078
    f_angle_d 1.141
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2506
    Nucleic Acid Atoms 0
    Heterogen Atoms 6
    Solvent Atoms 202
     
     
  •   Software and Computing Hide
    Computing
    Data Collection BSS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction SCALEPACK