X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Micro Batch
pH 4.2
Temperature 293.0
Details 30% PEG300, 0.2 M phosphate citrate, pH 4.2, micro-batch, temperature 293.0K
Method Micro Batch
pH 4.6
Temperature 293.0
Details 30% PEG300, 0.2M phosphate citrate, 0.15M lithium chloride, pH 4.6, micro-batch, temperature 293.0K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 44.33 α = 90
b = 174.82 β = 92.43
c = 56.16 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD a fixed exit Si double crystal monochromator followed by a two dimensional focusing mirror 2009-07-06
Diffraction Radiation
Monochromator Protocol
fixed exit Si double crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SPRING-8 BEAMLINE BL26B2 1.0 SPRING-8 BL26B2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.04 50 98.2 0.046 -- -- 4.2 -- 53147 -- -- 14.0
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.04 2.09 79.1 0.266 -- 5.77 4.1 3090

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.05 30.32 -- 0.0 -- 52190 5271 97.8 -- 0.201 0.201 0.25 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.05 2.17 7249 707 6542 0.206 0.274 0.01 80.8
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 35.2
Anisotropic B[1][1] -0.58
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.27
Anisotropic B[2][2] 0.26
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.32
RMS Deviations
Key Refinement Restraint Deviation
c_scangle_it 11.33
c_scbond_it 8.94
c_mcangle_it 7.26
c_mcbond_it 6.03
c_improper_angle_d 0.83
c_bond_d 0.008
c_angle_deg 1.1
c_dihedral_angle_d 17.1
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.22
Luzzati Sigma A (Observed) -0.03
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.28
Luzzati Sigma A (R-Free Set) 0.12
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5767
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 296

Software

Computing
Computing Package Purpose
BSS Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
SOLVE Structure Solution
CNS 1.3 Structure Refinement
Software
Software Name Purpose
CNS version: 1.3 refinement
SOLVE model building
BSS data collection