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X-RAY DIFFRACTION
Materials and Methods page
3VTO
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 16% PEG 20000, 0.1M MES, 0.15M sodium chloride, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 40.4 α = 90
    b = 152.4 β = 91.01
    c = 53.06 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX225HE
    Collection Date 2011-10-02
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SPRING-8 BEAMLINE BL44XU
    Wavelength List 0.9000
    Site SPRING-8
    Beamline BL44XU
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.44
    Resolution(Low) 50
    Number Reflections(Observed) 114876
    Percent Possible(Observed) 99.7
     
    High Resolution Shell Details
    Resolution(High) 1.44
    Resolution(Low) 1.46
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.44
    Resolution(Low) 19.52
    Number of Reflections(Observed) 108768
    Number of Reflections(R-Free) 5734
    Percent Reflections(Observed) 99.54
    R-Factor(Observed) 0.16391
    R-Work 0.16227
    R-Free 0.19458
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 18.937
    Anisotropic B[1][1] 0.19
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.03
    Anisotropic B[2][2] -0.06
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.14
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.441
    Shell Resolution(Low) 1.478
    Number of Reflections(R-Free) 407
    Number of Reflections(R-Work) 7785
    R-Factor(R-Work) 0.203
    R-Factor(R-Free) 0.267
    Percent Reflections(Observed) 96.98
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_rigid_bond_restr 2.08
    r_scangle_it 6.562
    r_scbond_it 4.337
    r_mcangle_it 2.723
    r_mcbond_it 1.734
    r_gen_planes_refined 0.009
    r_chiral_restr 0.108
    r_dihedral_angle_4_deg 23.849
    r_dihedral_angle_3_deg 11.91
    r_dihedral_angle_2_deg 27.112
    r_dihedral_angle_1_deg 6.848
    r_angle_refined_deg 1.636
    r_bond_refined_d 0.014
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4817
    Nucleic Acid Atoms 0
    Heterogen Atoms 6
    Solvent Atoms 578
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement REFMAC 5.5.0109
     
    Software
    refinement REFMAC version: 5.5.0109
    model building Phaser