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X-RAY DIFFRACTION
Materials and Methods page
3VSG
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 298.0
    Details 25% PEG 3350, 0.2M SODIUM CHLORIDE, PH 6.5, VAPOR DIFFUSION, HANGING DROP, TEMPERATURE 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 269.73 α = 90
    b = 48.26 β = 109.44
    c = 108.44 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 95
    Diffrn ID 2
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2007-06-15
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV++
    Details MIRRORS
    Collection Date 2007-04-25
     
    Diffraction Radiation
    Diffraction Protocol MAD
    Monochromator MIRRORS
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE AR-NW12A
    Wavelength List 0.9792, 0.9794, 0.9642
    Site PHOTON FACTORY
    Beamline AR-NW12A
    Source ROTATING ANODE
    Type RIGAKU FR-E SUPERBRIGHT
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.4
    Resolution(Low) 39.78
    Number Reflections(All) 52295
    Number Reflections(Observed) 48049
    Percent Possible(Observed) 91.8
    R Merge I(Observed) 0.073
    B(Isotropic) From Wilson Plot 34.0
    Redundancy 4.5
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.53
    Percent Possible(All) 82.5
    R Merge I(Observed) 0.323
    Mean I Over Sigma(Observed) 4.4
    R-Sym I(Observed) 0.323
    Redundancy 4.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 2.4
    Resolution(Low) 39.78
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 52295
    Number of Reflections(Observed) 45191
    Number of Reflections(R-Free) 2271
    Percent Reflections(Observed) 86.4
    R-Factor(Observed) 0.186
    R-Work 0.186
    R-Free 0.247
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model ISOTROPIC
    Mean Isotropic B Value 25.5
    Anisotropic B[1][1] 3.204
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -2.785
    Anisotropic B[2][2] -2.293
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.911
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4
    Shell Resolution(Low) 2.49
    Number of Reflections(R-Free) 174
    R-Factor(R-Work) 0.292
    R-Factor(R-Free) 0.379
    Percent Reflections(Observed) 73.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_improper_angle_d 0.87
    c_bond_d 0.007
    c_angle_deg 1.47
    c_dihedral_angle_d 23.31
     
    Coordinate Error
    Luzzati ESD(Observed) 0.26
    Luzzati Sigma A(Observed) 0.29
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.36
    Luzzati Sigma A(R-Free Set) 0.41
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8905
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 1310
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CrystalClear
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution SnB
    Structure Refinement CNS1.2
     
    Software
    refinement CNS1.2
    model building SnB
    data collection CrystalClear