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X-RAY DIFFRACTION
Materials and Methods page
3VR5
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 296.0
    Details 19.2% PEG3350, 0.2M NaF, 0.1M Bis-Tris propane, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 296K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 128.33 α = 90
    b = 129.32 β = 90
    c = 234.53 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2010-11-05
     
    Diffraction Radiation
    Monochromator Si(111) double crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE AR-NE3A
    Wavelength List 1.0000
    Site PHOTON FACTORY
    Beamline AR-NE3A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 3.9
    Resolution(Low) 50
    Number Reflections(All) 36120
    Number Reflections(Observed) 36120
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.167
    B(Isotropic) From Wilson Plot 75.839
    Redundancy 7.2
     
    High Resolution Shell Details
    Resolution(High) 3.9
    Resolution(Low) 4.14
    Percent Possible(All) 98.5
    R Merge I(Observed) 0.602
    Mean I Over Sigma(Observed) 3.5
    Redundancy 7.2
    Number Unique Reflections(All) 5663
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.9
    Resolution(Low) 49.6
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 33768
    Number of Reflections(Observed) 33768
    Number of Reflections(R-Free) 1659
    Percent Reflections(Observed) 97.71
    R-Factor(All) 0.20896
    R-Factor(Observed) 0.20896
    R-Work 0.20696
    R-Free 0.25
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 100.468
    Anisotropic B[1][1] -95.15
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.53
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 94.62
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.901
    Shell Resolution(Low) 4.001
    Number of Reflections(Observed) 1815
    Number of Reflections(R-Free) 83
    Number of Reflections(R-Work) 1732
    R-Factor(R-Work) 0.221
    R-Factor(R-Free) 0.318
    Percent Reflections(Observed) 69.38
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_refined 0.005
    r_chiral_restr 0.082
    r_dihedral_angle_4_deg 15.973
    r_dihedral_angle_3_deg 12.888
    r_dihedral_angle_2_deg 35.11
    r_dihedral_angle_1_deg 5.161
    r_angle_refined_deg 1.407
    r_bond_refined_d 0.013
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 23655
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection UGUI
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement REFMAC 5.6.0117
     
    Software
    refinement REFMAC version: 5.6.0117
    model building PHASER
    data collection UGUI