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X-RAY DIFFRACTION
Materials and Methods page
3VQG
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 277.0
    Details 30% polyethlene glycol monomethyl ether 5000, 0.2M ammonium sulfate, 0.1M MES, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 60.85 α = 90
    b = 50.77 β = 120.08
    c = 33.14 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2011-03-13
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE BL-1A
    Wavelength List 1.0
    Site PHOTON FACTORY
    Beamline BL-1A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.35
    Resolution(Low) 30
    Number Reflections(All) 18907
    Number Reflections(Observed) 18907
    Percent Possible(Observed) 98.7
    R Merge I(Observed) 0.091
    B(Isotropic) From Wilson Plot 14.67
    Redundancy 3.5
     
    High Resolution Shell Details
    Resolution(High) 1.35
    Resolution(Low) 1.37
    Percent Possible(All) 99.7
    R Merge I(Observed) 0.991
    Mean I Over Sigma(Observed) 43.8
    Redundancy 3.5
    Number Unique Reflections(All) 952
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.35
    Resolution(Low) 26.328
    Cut-off Sigma(F) 1.39
    Number of Reflections(all) 18907
    Number of Reflections(Observed) 18904
    Number of Reflections(R-Free) 974
    Percent Reflections(Observed) 98.32
    R-Factor(Observed) 0.1718
    R-Work 0.1699
    R-Free 0.2067
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 9.5138
    Anisotropic B[1][1] 9.3562
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 5.2577
    Anisotropic B[2][2] 6.1693
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 10.3533
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3501
    Shell Resolution(Low) 1.4213
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2506
    R-Factor(R-Work) 0.2363
    R-Factor(R-Free) 0.26
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4213
    Shell Resolution(Low) 1.5104
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.2026
    R-Factor(R-Free) 0.2558
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5104
    Shell Resolution(Low) 1.627
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2606
    R-Factor(R-Work) 0.1633
    R-Factor(R-Free) 0.2054
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.627
    Shell Resolution(Low) 1.7906
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2608
    R-Factor(R-Work) 0.1507
    R-Factor(R-Free) 0.1972
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7906
    Shell Resolution(Low) 2.0497
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2592
    R-Factor(R-Work) 0.1459
    R-Factor(R-Free) 0.1759
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0497
    Shell Resolution(Low) 2.582
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2573
    R-Factor(R-Work) 0.1503
    R-Factor(R-Free) 0.1943
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.582
    Shell Resolution(Low) 26.3329
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2447
    R-Factor(R-Work) 0.1852
    R-Factor(R-Free) 0.2166
    Percent Reflections(Observed) 92.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 11.993
    f_plane_restr 0.005
    f_chiral_restr 0.066
    f_angle_d 1.032
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 700
    Nucleic Acid Atoms 0
    Heterogen Atoms 5
    Solvent Atoms 117
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building MOLREP
    data collection HKL-2000