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X-RAY DIFFRACTION
Materials and Methods page
3VQF
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 277.0
    Details 23% PEG 8000, 0.2M sodium acetate, 0.1M Bis-Tris, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 60.49 α = 90
    b = 51.21 β = 120
    c = 33.29 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210r
    Collection Date 2011-02-10
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE AR-NW12A
    Wavelength List 1.0
    Site PHOTON FACTORY
    Beamline AR-NW12A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.2
    Resolution(Low) 30
    Number Reflections(All) 27352
    Number Reflections(Observed) 27350
    Percent Possible(Observed) 99.1
    R Merge I(Observed) 0.062
    B(Isotropic) From Wilson Plot 10.91
    Redundancy 13.1
     
    High Resolution Shell Details
    Resolution(High) 1.2
    Resolution(Low) 1.22
    Percent Possible(All) 98.4
    R Merge I(Observed) 0.184
    Mean I Over Sigma(Observed) 5.1
    Redundancy 7.2
    Number Unique Reflections(All) 1332
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.199
    Resolution(Low) 26.195
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 27352
    Number of Reflections(Observed) 27350
    Number of Reflections(R-Free) 1396
    Percent Reflections(Observed) 99.0
    R-Factor(Observed) 0.1457
    R-Work 0.1447
    R-Free 0.1639
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 15.669
    Anisotropic B[1][1] -0.0773
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.4067
    Anisotropic B[2][2] -0.5969
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.6742
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1986
    Shell Resolution(Low) 1.2414
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2525
    R-Factor(R-Work) 0.1599
    R-Factor(R-Free) 0.1631
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2414
    Shell Resolution(Low) 1.2911
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2541
    R-Factor(R-Work) 0.1498
    R-Factor(R-Free) 0.2034
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2911
    Shell Resolution(Low) 1.3499
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.138
    R-Factor(R-Free) 0.1768
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3499
    Shell Resolution(Low) 1.421
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2613
    R-Factor(R-Work) 0.1251
    R-Factor(R-Free) 0.1499
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.421
    Shell Resolution(Low) 1.51
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2583
    R-Factor(R-Work) 0.1186
    R-Factor(R-Free) 0.152
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.51
    Shell Resolution(Low) 1.6266
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.1177
    R-Factor(R-Free) 0.153
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6266
    Shell Resolution(Low) 1.7903
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2610
    R-Factor(R-Work) 0.1346
    R-Factor(R-Free) 0.1838
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7903
    Shell Resolution(Low) 2.0492
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2634
    R-Factor(R-Work) 0.1471
    R-Factor(R-Free) 0.1768
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0492
    Shell Resolution(Low) 2.5815
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.1494
    R-Factor(R-Free) 0.1685
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5815
    Shell Resolution(Low) 26.201
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2637
    R-Factor(R-Work) 0.1548
    R-Factor(R-Free) 0.1525
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.444
    f_plane_restr 0.005
    f_chiral_restr 0.075
    f_angle_d 1.087
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 670
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 181
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building MOLREP
    data collection HKL-2000