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X-RAY DIFFRACTION
Materials and Methods page
3VQE
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.6
    Temperature 295.0
    Details 1.6M AmSO4, 0.1M Na Citrate pH 4.6, 50mM CdCl2, VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 49.46 α = 90
    b = 49.46 β = 90
    c = 103.23 γ = 120
     
    Space Group
    Space Group Name:    P 32
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210r
    Details mirrors
    Collection Date 2008-04-22
     
    Diffraction Radiation
    Monochromator double mirror
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type AUSTRALIAN SYNCHROTRON BEAMLINE MX1
    Wavelength List 0.9567
    Site AUSTRALIAN SYNCHROTRON
    Beamline MX1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Resolution(High) 1.7
    Resolution(Low) 50
    Number Reflections(All) 31059
    Number Reflections(Observed) 30896
    Percent Possible(Observed) 99.5
    R Merge I(Observed) 0.047
    B(Isotropic) From Wilson Plot 21.95
    Redundancy 5.6
     
    High Resolution Shell Details
    Resolution(High) 1.7
    Resolution(Low) 1.8
    Percent Possible(All) 99.5
    R Merge I(Observed) 0.29
    Mean I Over Sigma(Observed) 6.15
    R-Sym I(Observed) 0.308
    Redundancy 5.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.7
    Resolution(Low) 26.826
    Cut-off Sigma(F) 1.99
    Number of Reflections(all) 31051
    Number of Reflections(Observed) 30890
    Number of Reflections(R-Free) 1543
    Percent Reflections(Observed) 99.48
    R-Factor(All) 0.2044
    R-Factor(Observed) 0.1995
    R-Work 0.1984
    R-Free 0.2215
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.3738
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.3738
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.7476
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7001
    Shell Resolution(Low) 1.755
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2672
    R-Factor(R-Work) 0.2648
    R-Factor(R-Free) 0.2988
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.755
    Shell Resolution(Low) 1.8177
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2670
    R-Factor(R-Work) 0.2376
    R-Factor(R-Free) 0.2532
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8177
    Shell Resolution(Low) 1.8904
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.217
    R-Factor(R-Free) 0.2537
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8904
    Shell Resolution(Low) 1.9764
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.213
    R-Factor(R-Free) 0.2496
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9764
    Shell Resolution(Low) 2.0806
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.1892
    R-Factor(R-Free) 0.2358
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0806
    Shell Resolution(Low) 2.2109
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2656
    R-Factor(R-Work) 0.1912
    R-Factor(R-Free) 0.2126
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2109
    Shell Resolution(Low) 2.3815
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2696
    R-Factor(R-Work) 0.1969
    R-Factor(R-Free) 0.2571
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3815
    Shell Resolution(Low) 2.621
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.1817
    R-Factor(R-Free) 0.1845
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.621
    Shell Resolution(Low) 2.9998
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.1898
    R-Factor(R-Free) 0.2009
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9998
    Shell Resolution(Low) 3.7778
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2701
    R-Factor(R-Work) 0.1903
    R-Factor(R-Free) 0.2204
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7778
    Shell Resolution(Low) 26.8292
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2629
    R-Factor(R-Work) 0.2029
    R-Factor(R-Free) 0.2143
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.083
    f_dihedral_angle_d 14.581
    f_angle_d 1.495
    f_bond_d 0.013
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2076
    Nucleic Acid Atoms 0
    Heterogen Atoms 56
    Solvent Atoms 77
     
     
  •   Software and Computing Hide
    Computing
    Data Collection BlueIce
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution AMoRE
    Structure Refinement PHENIX (phenix.refine: dev_986)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_986)
    model building AMoRE
    data collection BlueIce