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X-RAY DIFFRACTION
Materials and Methods page
3VLI
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 288.0
    Details 1mM KCN, 2.36-2.58M Ammonium sulfate, 0.5M potassium chloride, 20mM sodium phosphate, VAPOR DIFFUSION, HANGING DROP, temperature 288K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 315.88 α = 90
    b = 81.43 β = 99.72
    c = 75.58 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Details mirrors
    Collection Date 2006-04-26
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE AR-NW12A
    Wavelength List 1
    Site PHOTON FACTORY
    Beamline AR-NW12A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.7
    Resolution(Low) 50
    Number Reflections(All) 206605
    Number Reflections(Observed) 201276
    Percent Possible(Observed) 97.4
    R Merge I(Observed) 0.067
    B(Isotropic) From Wilson Plot 25.2
    Redundancy 7.5
     
    High Resolution Shell Details
    Resolution(High) 1.7
    Resolution(Low) 1.76
    Percent Possible(All) 96.0
    R Merge I(Observed) 0.506
    Mean I Over Sigma(Observed) 3.9
    Redundancy 3.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.7
    Resolution(Low) 39.39
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 201276
    Number of Reflections(Observed) 201276
    Number of Reflections(R-Free) 9892
    Percent Reflections(Observed) 97.1
    R-Factor(Observed) 0.218
    R-Work 0.218
    R-Free 0.234
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 27.4
    Anisotropic B[1][1] 0.22
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -2.43
    Anisotropic B[2][2] -0.46
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.24
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7
    Shell Resolution(Low) 1.81
    Number of Reflections(R-Free) 1595
    Number of Reflections(R-Work) 30692
    R-Factor(R-Work) 0.244
    R-Factor(R-Free) 0.264
    R-Free Error 0.007
    Percent Reflections(Observed) 93.9
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_improper_angle_d 1.09
    c_bond_d 0.011
    c_angle_deg 1.5
    c_dihedral_angle_d 22.1
     
    Coordinate Error
    Luzzati ESD(Observed) 0.21
    Luzzati Sigma A(Observed) 0.03
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.23
    Luzzati Sigma A(R-Free Set) 0.1
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 11216
    Nucleic Acid Atoms 0
    Heterogen Atoms 90
    Solvent Atoms 564
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CNS
    Structure Refinement CNS 1.1
     
    Software
    refinement CNS version: 1.1
    model building CNS
    data collection ADSC version: Quantum