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X-RAY DIFFRACTION
Materials and Methods page
3VLH
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 288.0
    Details 2.36-2.58M Ammonium sulfate, 0.5M potassium chloride, 20mM sodium phosphate, VAPOR DIFFUSION, HANGING DROP, temperature 288K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 317.15 α = 90
    b = 81.86 β = 99.98
    c = 75.56 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2006-03-01
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE AR-NW12A
    Wavelength List 1
    Site PHOTON FACTORY
    Beamline AR-NW12A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.73
    Resolution(Low) 37.07
    Number Reflections(All) 195739
    Number Reflections(Observed) 195739
    Percent Possible(Observed) 99.0
    R Merge I(Observed) 0.098
    B(Isotropic) From Wilson Plot 26.7
    Redundancy 7.1
     
    High Resolution Shell Details
    Resolution(High) 1.73
    Resolution(Low) 1.79
    Percent Possible(All) 93.2
    R Merge I(Observed) 0.318
    Mean I Over Sigma(Observed) 1.6
    Redundancy 2.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.73
    Resolution(Low) 37.07
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 195739
    Number of Reflections(Observed) 195739
    Number of Reflections(R-Free) 9624
    Percent Reflections(Observed) 98.5
    R-Work 0.249
    R-Free 0.268
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 31.2
    Anisotropic B[1][1] -7.08
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -6.94
    Anisotropic B[2][2] 0.35
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 6.73
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.73
    Shell Resolution(Low) 1.84
    Number of Reflections(R-Free) 1579
    Number of Reflections(R-Work) 28963
    R-Factor(R-Work) 0.345
    R-Factor(R-Free) 0.368
    R-Free Error 0.009
    Percent Reflections(Observed) 92.7
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_improper_angle_d 0.93
    c_dihedral_angle_d 21.9
    c_angle_deg 1.5
    c_bond_d 0.006
     
    Coordinate Error
    Luzzati ESD(Observed) 0.27
    Luzzati Sigma A(Observed) 0.27
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.29
    Luzzati Sigma A(R-Free Set) 0.28
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 11207
    Nucleic Acid Atoms 0
    Heterogen Atoms 86
    Solvent Atoms 308
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CNS
    Structure Refinement CNS 1.1
     
    Software
    refinement CNS version: 1.1
    model building CNS
    data collection ADSC version: Quantum