X-RAY DIFFRACTION Experimental Data & Validation


Lost? View more X-Ray Crystallographic info.

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.8
Temperature 300.0
Details 1.0-1.3M ammonium sulfate, 0.1M Tris-Cl, 5% 2-Methyl-2,4-pentanediol(MPD), 3% Glycerol, pH 7.8, VAPOR DIFFUSION, HANGING DROP, temperature 300K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 80.43 α = 90
b = 35.7 β = 122.59
c = 50.92 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR scanner 300 mm plate Mirror 2010-01-07
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE BM14 0.978 ESRF BM14

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 33.88 96.8 0.062 -- -- 7.1 -- 9711 1.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.9 2.0 -- 0.588 -- 3.4 7.1 10166

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.901 33.883 0.0 1.0 -- 9478 456 97.05 -- 0.1999 0.1978 0.2384 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9013 2.1764 -- 132 2865 0.2277 0.2705 -- 93.0
X Ray Diffraction 2.1764 2.7418 -- 156 3046 0.1855 0.2685 -- 99.0
X Ray Diffraction 2.7418 33.8884 -- 168 3111 0.197 0.225 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 46.9634
Anisotropic B[1][1] -5.3144
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -3.8419
Anisotropic B[2][2] 9.6949
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -4.3805
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 14.687
f_plane_restr 0.003
f_chiral_restr 0.059
f_angle_d 0.9
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 943
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 13

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
MOSFLM Data Reduction (intensity integration)
SCALA Data Reduction (data scaling)
SOLVE Structure Solution
PHENIX (phenix.refine: 1.7_650) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7_650) refinement
SOLVE model building
HKL-2000 data collection