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X-RAY DIFFRACTION
Materials and Methods page
3VEJ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5
    Temperature 298.0
    Details 3.4 M ammonium sulfate, 0.1 M sodium citrate, pH 5.0, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 25.02 α = 90
    b = 46.34 β = 96.9
    c = 28.27 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2011-01-01
     
    Diffraction Radiation
    Monochromator Liquid nitrogen-cooled double crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL12-2
    Wavelength List 1.000
    Site SSRL
    Beamline BL12-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.23
    Resolution(Low) 46.34
    Number Reflections(Observed) 18288
    Percent Possible(Observed) 97.9
    R Merge I(Observed) 0.058
    B(Isotropic) From Wilson Plot 11.91
    Redundancy 4.2
     
    High Resolution Shell Details
    Resolution(High) 1.23
    Resolution(Low) 1.26
    Percent Possible(All) 94.6
    R Merge I(Observed) 0.609
    Mean I Over Sigma(Observed) 2.05
    Redundancy 3.87
    Number Unique Reflections(All) 1302
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.23
    Resolution(Low) 24.839
    Cut-off Sigma(F) 1.39
    Number of Reflections(Observed) 18274
    Number of Reflections(R-Free) 1089
    Percent Reflections(Observed) 97.89
    R-Factor(Observed) 0.1782
    R-Work 0.1766
    R-Free 0.2039
    R-Free Selection Details Random 6%
     
    Temperature Factor Modeling
    Isotropic Thermal Model Mixed isotropic and anisotropic
    Anisotropic B[1][1] -0.4035
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.8457
    Anisotropic B[2][2] -1.177
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.5804
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2299
    Shell Resolution(Low) 1.2859
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2084
    R-Factor(R-Work) 0.3097
    R-Factor(R-Free) 0.3587
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2859
    Shell Resolution(Low) 1.3537
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2161
    R-Factor(R-Work) 0.2519
    R-Factor(R-Free) 0.2723
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3537
    Shell Resolution(Low) 1.4385
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2153
    R-Factor(R-Work) 0.1984
    R-Factor(R-Free) 0.2431
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4385
    Shell Resolution(Low) 1.5496
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2202
    R-Factor(R-Work) 0.1649
    R-Factor(R-Free) 0.1914
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5496
    Shell Resolution(Low) 1.7055
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2114
    R-Factor(R-Work) 0.148
    R-Factor(R-Free) 0.2
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7055
    Shell Resolution(Low) 1.9522
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2140
    R-Factor(R-Work) 0.1611
    R-Factor(R-Free) 0.1714
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9522
    Shell Resolution(Low) 2.4592
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2155
    R-Factor(R-Work) 0.1656
    R-Factor(R-Free) 0.2108
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4592
    Shell Resolution(Low) 24.8438
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2176
    R-Factor(R-Work) 0.1714
    R-Factor(R-Free) 0.187
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.078
    f_dihedral_angle_d 13.637
    f_angle_d 1.082
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 655
    Nucleic Acid Atoms 0
    Heterogen Atoms 5
    Solvent Atoms 86
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Blu-Ice
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution SOLVE
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building SOLVE
    data collection Blu-Ice