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X-RAY DIFFRACTION
Materials and Methods page
3VE9
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.6
    Temperature 293.0
    Details 30% PEG 4000, 0.1M sodium acetate, 0.2M ammonium acetate, pH 4.6, VAPOR DIFFUSION, HANGING DROP, temperature 293.0K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 46.1 α = 90
    b = 74.87 β = 95.54
    c = 55.1 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2010-08-19
     
    Diffraction Radiation
    Monochromator MIRRORS
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.075
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.45
    Resolution(Low) 45.88
    Number Reflections(All) 61286
    Number Reflections(Observed) 61286
    Percent Possible(Observed) 92.97
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.45
    Resolution(Low) 45.882
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 61286
    Number of Reflections(Observed) 61286
    Number of Reflections(R-Free) 3104
    Percent Reflections(Observed) 92.97
    R-Factor(All) 0.1943
    R-Factor(Observed) 0.1943
    R-Work 0.1933
    R-Free 0.2136
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.4758
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.8895
    Anisotropic B[2][2] 0.0
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.4758
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.45
    Shell Resolution(Low) 1.4727
    Number of Reflections(R-Free) 50
    Number of Reflections(R-Work) 1168
    R-Factor(R-Work) 0.4194
    R-Factor(R-Free) 0.3573
    Percent Reflections(Observed) 41.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4727
    Shell Resolution(Low) 1.4969
    Number of Reflections(R-Free) 74
    Number of Reflections(R-Work) 1810
    R-Factor(R-Work) 0.3604
    R-Factor(R-Free) 0.4278
    Percent Reflections(Observed) 63.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4969
    Shell Resolution(Low) 1.5227
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2276
    R-Factor(R-Work) 0.301
    R-Factor(R-Free) 0.3334
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5227
    Shell Resolution(Low) 1.5504
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2564
    R-Factor(R-Work) 0.2754
    R-Factor(R-Free) 0.2871
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5504
    Shell Resolution(Low) 1.5802
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2701
    R-Factor(R-Work) 0.238
    R-Factor(R-Free) 0.3131
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5802
    Shell Resolution(Low) 1.6124
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2709
    R-Factor(R-Work) 0.2238
    R-Factor(R-Free) 0.247
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6124
    Shell Resolution(Low) 1.6475
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2781
    R-Factor(R-Work) 0.2089
    R-Factor(R-Free) 0.2629
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6475
    Shell Resolution(Low) 1.6858
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2753
    R-Factor(R-Work) 0.1942
    R-Factor(R-Free) 0.238
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6858
    Shell Resolution(Low) 1.728
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2780
    R-Factor(R-Work) 0.1931
    R-Factor(R-Free) 0.21
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.728
    Shell Resolution(Low) 1.7747
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2774
    R-Factor(R-Work) 0.1877
    R-Factor(R-Free) 0.2091
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7747
    Shell Resolution(Low) 1.8269
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2774
    R-Factor(R-Work) 0.1918
    R-Factor(R-Free) 0.2383
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8269
    Shell Resolution(Low) 1.8859
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2768
    R-Factor(R-Work) 0.1886
    R-Factor(R-Free) 0.2131
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8859
    Shell Resolution(Low) 1.9533
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2811
    R-Factor(R-Work) 0.1957
    R-Factor(R-Free) 0.228
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9533
    Shell Resolution(Low) 2.0315
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2797
    R-Factor(R-Work) 0.1917
    R-Factor(R-Free) 0.2046
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0315
    Shell Resolution(Low) 2.124
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2837
    R-Factor(R-Work) 0.2029
    R-Factor(R-Free) 0.2408
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.124
    Shell Resolution(Low) 2.2359
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2807
    R-Factor(R-Work) 0.1967
    R-Factor(R-Free) 0.227
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2359
    Shell Resolution(Low) 2.376
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 2835
    R-Factor(R-Work) 0.1882
    R-Factor(R-Free) 0.2157
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.376
    Shell Resolution(Low) 2.5595
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2840
    R-Factor(R-Work) 0.1925
    R-Factor(R-Free) 0.2362
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5595
    Shell Resolution(Low) 2.817
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2824
    R-Factor(R-Work) 0.2011
    R-Factor(R-Free) 0.2317
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.817
    Shell Resolution(Low) 3.2245
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2844
    R-Factor(R-Work) 0.1945
    R-Factor(R-Free) 0.199
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2245
    Shell Resolution(Low) 4.0622
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2826
    R-Factor(R-Work) 0.1655
    R-Factor(R-Free) 0.1748
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0622
    Shell Resolution(Low) 45.9046
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2903
    R-Factor(R-Work) 0.178
    R-Factor(R-Free) 0.1747
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.067
    f_dihedral_angle_d 11.117
    f_angle_d 1.014
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3142
    Nucleic Acid Atoms 0
    Heterogen Atoms 13
    Solvent Atoms 318
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX
    data collection CBASS