X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8.5
Temperature 277.0
Details 20~26% PEG4K, 0.2M MgCl2.6H2O, 0.1M Tris, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 44.33 α = 90
b = 92.27 β = 108.13
c = 70.19 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2011-06-08
Diffraction Radiation
Monochromator Protocol
Double Crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 1.7 SSRF BL17U

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.98 50 94.3 0.09 -- -- 14.6 37428 35295 1.0 1.0 25.3
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.98 2.05 90.6 0.454 -- 6.6 14.7 3770

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.979 25.912 -- 1.36 37458 35241 1755 94.08 0.2067 0.1945 0.193 0.224 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9793 2.05 -- 156 3198 0.236 0.264 -- 89.0
X Ray Diffraction 2.05 2.132 -- 185 3241 0.2141 0.2643 -- 92.0
X Ray Diffraction 2.132 2.229 -- 176 3264 0.2076 0.2722 -- 93.0
X Ray Diffraction 2.229 2.3464 -- 169 3302 0.1979 0.2273 -- 93.0
X Ray Diffraction 2.3464 2.4933 -- 179 3311 0.203 0.2636 -- 94.0
X Ray Diffraction 2.4933 2.6857 -- 149 3368 0.2094 0.2401 -- 95.0
X Ray Diffraction 2.6857 2.9556 -- 198 3392 0.2172 0.25 -- 95.0
X Ray Diffraction 2.9556 3.3825 -- 185 3415 0.2049 0.2463 -- 96.0
X Ray Diffraction 3.3825 4.2585 -- 199 3433 0.168 0.1826 -- 97.0
X Ray Diffraction 4.2585 25.9142 -- 159 3562 0.1716 0.1879 -- 98.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 29.7
Anisotropic B[1][1] 0.694
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.5125
Anisotropic B[2][2] 0.7704
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -1.4644
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 15.748
f_plane_restr 0.005
f_chiral_restr 0.087
f_angle_d 1.105
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3603
Nucleic Acid Atoms 0
Heterogen Atoms 17
Solvent Atoms 325

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHENIX(phenix.autosol) Structure Solution
PHENIX (phenix.refine: 1.6.4_486) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.6.4_486) refinement
PHENIX(phenix.autosol) model building
HKL-2000 data collection