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X-RAY DIFFRACTION
Materials and Methods page
3V81
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 6.8
    Temperature 277.0
    Details PEG 8000, ammonium sulfate, sucrose, glycerol, magnesium chloride, Bis-Tris propane , pH 6.8, VAPOR DIFFUSION, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 89.82 α = 90
    b = 132.05 β = 100.84
    c = 142.73 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Details mirror
    Collection Date 2011-03-13
     
    Diffraction Radiation
    Monochromator Rh coated Si
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE F1
    Wavelength List 0.918
    Site CHESS
    Beamline F1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -1.0
    Resolution(High) 2.85
    Resolution(Low) 40
    Number Reflections(Observed) 75389
    Percent Possible(Observed) 99.0
    R Merge I(Observed) 0.09
    Redundancy 3.6
     
    High Resolution Shell Details
    Resolution(High) 2.85
    Resolution(Low) 2.9
    Percent Possible(All) 97.7
    R Merge I(Observed) 0.618
    Redundancy 2.9
    Number Unique Reflections(All) 3706
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.8503
    Resolution(Low) 38.413
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 75359
    Number of Reflections(R-Free) 2287
    Percent Reflections(Observed) 98.68
    R-Factor(Observed) 0.252
    R-Work 0.2505
    R-Free 0.298
     
    Temperature Factor Modeling
    Mean Isotropic B Value 82.9103
    Anisotropic B[1][1] -2.1261
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 2.7078
    Anisotropic B[2][2] 5.1163
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.9902
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8503
    Shell Resolution(Low) 2.9123
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 4322
    R-Factor(R-Work) 0.3912
    R-Factor(R-Free) 0.4495
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9123
    Shell Resolution(Low) 2.98
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 4517
    R-Factor(R-Work) 0.3635
    R-Factor(R-Free) 0.428
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.98
    Shell Resolution(Low) 3.0545
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 4544
    R-Factor(R-Work) 0.3502
    R-Factor(R-Free) 0.3582
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0545
    Shell Resolution(Low) 3.137
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 4582
    R-Factor(R-Work) 0.3325
    R-Factor(R-Free) 0.3543
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.137
    Shell Resolution(Low) 3.2293
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 4529
    R-Factor(R-Work) 0.3066
    R-Factor(R-Free) 0.3405
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2293
    Shell Resolution(Low) 3.3335
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 4595
    R-Factor(R-Work) 0.2904
    R-Factor(R-Free) 0.3453
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3335
    Shell Resolution(Low) 3.4525
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4614
    R-Factor(R-Work) 0.2735
    R-Factor(R-Free) 0.342
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4525
    Shell Resolution(Low) 3.5907
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 4590
    R-Factor(R-Work) 0.2595
    R-Factor(R-Free) 0.3284
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5907
    Shell Resolution(Low) 3.754
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4619
    R-Factor(R-Work) 0.2456
    R-Factor(R-Free) 0.2657
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.754
    Shell Resolution(Low) 3.9517
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4574
    R-Factor(R-Work) 0.2278
    R-Factor(R-Free) 0.2709
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9517
    Shell Resolution(Low) 4.199
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 4605
    R-Factor(R-Work) 0.211
    R-Factor(R-Free) 0.2565
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.199
    Shell Resolution(Low) 4.5228
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 4616
    R-Factor(R-Work) 0.2026
    R-Factor(R-Free) 0.2497
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5228
    Shell Resolution(Low) 4.977
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 4634
    R-Factor(R-Work) 0.2035
    R-Factor(R-Free) 0.2653
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.977
    Shell Resolution(Low) 5.6952
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 4639
    R-Factor(R-Work) 0.2146
    R-Factor(R-Free) 0.2698
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6952
    Shell Resolution(Low) 7.1677
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 4659
    R-Factor(R-Work) 0.2507
    R-Factor(R-Free) 0.3282
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.1677
    Shell Resolution(Low) 38.4166
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4433
    R-Factor(R-Work) 0.2249
    R-Factor(R-Free) 0.2658
    Percent Reflections(Observed) 93.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 18.556
    f_plane_restr 0.007
    f_chiral_restr 0.091
    f_angle_d 1.337
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 15824
    Nucleic Acid Atoms 1646
    Heterogen Atoms 40
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    data reduction HKL