X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 296.0
Details PEG 3350, NaCl, Glycerol, Cacodylate, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 296K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 37.42 α = 90
b = 71.39 β = 90.52
c = 82.9 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR CCD 165 mm -- 2011-04-09
Diffraction Radiation
Monochromator Protocol
Single crystal bender SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4C 0.97931 NSLS X4C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.66 19.54 89.7 -- 0.142 -- 2.8 -- 10608 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.66 2.7 84.0 -- 0.448 1.97 2.5 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.66 19.53 -- 1.0 26645 10608 569 84.0 -- 0.2601 0.2558 0.3348 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.6601 2.927 -- 122 2206 0.3202 0.4316 -- 75.0
X Ray Diffraction 2.927 3.3487 -- 142 2498 0.2818 0.3777 -- 84.0
X Ray Diffraction 3.3487 4.212 -- 153 2663 0.2434 0.3316 -- 89.0
X Ray Diffraction 4.212 19.538 -- 152 2672 0.2415 0.3041 -- 88.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 29.6865
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -10.5685
Anisotropic B[2][2] 30.7147
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 48.8921
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.006
f_chiral_restr 0.099
f_dihedral_angle_d 18.111
f_angle_d 1.596
f_bond_d 0.012
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2538
Nucleic Acid Atoms 0
Heterogen Atoms 9
Solvent Atoms 80

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
SCALA Data Reduction (data scaling)
Molecular Replacement Structure Solution
PHENIX (phenix.refine: 1.7.2_869) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.2_869) refinement
Molecular version: Replacement model building
HKL-2000 data collection