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X-RAY DIFFRACTION
Materials and Methods page
3V7L
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 296.0
    Details PEG 3350, NaCl, Glycerol, Cacodylate, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 296K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 37.42 α = 90
    b = 71.39 β = 90.52
    c = 82.9 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
    Collection Date 2011-04-09
     
    Diffraction Radiation
    Monochromator Single crystal bender
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X4C
    Wavelength List 0.97931
    Site NSLS
    Beamline X4C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.66
    Resolution(Low) 19.54
    Number Reflections(Observed) 10608
    Percent Possible(Observed) 89.7
    Redundancy 2.8
     
    High Resolution Shell Details
    Resolution(High) 2.66
    Resolution(Low) 2.7
    Percent Possible(All) 84.0
    Mean I Over Sigma(Observed) 1.97
    R-Sym I(Observed) 0.448
    Redundancy 2.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.66
    Resolution(Low) 19.53
    Cut-off Sigma(F) 1.0
    Number of Reflections(all) 26645
    Number of Reflections(Observed) 10608
    Number of Reflections(R-Free) 569
    Percent Reflections(Observed) 84.0
    R-Factor(Observed) 0.2601
    R-Work 0.2558
    R-Free 0.3348
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 29.6865
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -10.5685
    Anisotropic B[2][2] 30.7147
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 48.8921
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6601
    Shell Resolution(Low) 2.927
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2206
    R-Factor(R-Work) 0.3202
    R-Factor(R-Free) 0.4316
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.927
    Shell Resolution(Low) 3.3487
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2498
    R-Factor(R-Work) 0.2818
    R-Factor(R-Free) 0.3777
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3487
    Shell Resolution(Low) 4.212
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2663
    R-Factor(R-Work) 0.2434
    R-Factor(R-Free) 0.3316
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.212
    Shell Resolution(Low) 19.538
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2672
    R-Factor(R-Work) 0.2415
    R-Factor(R-Free) 0.3041
    Percent Reflections(Observed) 88.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.099
    f_dihedral_angle_d 18.111
    f_angle_d 1.596
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2538
    Nucleic Acid Atoms 0
    Heterogen Atoms 9
    Solvent Atoms 80
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALA
    Structure Solution Molecular Replacement
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building Molecular version: Replacement
    data collection HKL-2000