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X-RAY DIFFRACTION
Materials and Methods page
3V7K
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 296.0
    Details PEG 3350, NaCl, Glycerol, Cacodylate, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 296K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 56.46 α = 90
    b = 75.51 β = 90
    c = 117.36 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2011-09-14
     
    Diffraction Radiation
    Monochromator Single crystal bender
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 1.04
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.27
    Resolution(Low) 30.3
    Number Reflections(All) 201278
    Number Reflections(Observed) 23840
    Percent Possible(Observed) 91.49
    Redundancy 8.8
     
    High Resolution Shell Details
    Resolution(High) 2.2711
    Resolution(Low) 2.3279
    Percent Possible(All) 72.7
    Mean I Over Sigma(Observed) 1.627
    R-Sym I(Observed) 0.649
    Redundancy 5.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.271
    Resolution(Low) 30.3
    Cut-off Sigma(F) 0.09
    Number of Reflections(Observed) 21799
    Number of Reflections(R-Free) 1899
    Percent Reflections(Observed) 91.49
    R-Factor(Observed) 0.2298
    R-Work 0.2253
    R-Free 0.277
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.3239
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 12.6877
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.8635
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2711
    Shell Resolution(Low) 2.3279
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 1199
    R-Factor(R-Work) 0.2973
    R-Factor(R-Free) 0.3623
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3279
    Shell Resolution(Low) 2.3908
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 1382
    R-Factor(R-Work) 0.2705
    R-Factor(R-Free) 0.3112
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3908
    Shell Resolution(Low) 2.4611
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1394
    R-Factor(R-Work) 0.2777
    R-Factor(R-Free) 0.3095
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4611
    Shell Resolution(Low) 2.5405
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1397
    R-Factor(R-Work) 0.2773
    R-Factor(R-Free) 0.2964
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5405
    Shell Resolution(Low) 2.6313
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1423
    R-Factor(R-Work) 0.2847
    R-Factor(R-Free) 0.378
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6313
    Shell Resolution(Low) 2.7366
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1441
    R-Factor(R-Work) 0.2496
    R-Factor(R-Free) 0.2942
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7366
    Shell Resolution(Low) 2.861
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1488
    R-Factor(R-Work) 0.2523
    R-Factor(R-Free) 0.3114
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.861
    Shell Resolution(Low) 3.0118
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1509
    R-Factor(R-Work) 0.2325
    R-Factor(R-Free) 0.2655
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0118
    Shell Resolution(Low) 3.2003
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1508
    R-Factor(R-Work) 0.2337
    R-Factor(R-Free) 0.2654
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2003
    Shell Resolution(Low) 3.447
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1504
    R-Factor(R-Work) 0.2319
    R-Factor(R-Free) 0.2898
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.447
    Shell Resolution(Low) 3.7933
    Number of Reflections(R-Free) 106
    Number of Reflections(R-Work) 1099
    R-Factor(R-Work) 0.3059
    R-Factor(R-Free) 0.3161
    Percent Reflections(Observed) 70.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7933
    Shell Resolution(Low) 4.3409
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 1348
    R-Factor(R-Work) 0.202
    R-Factor(R-Free) 0.2861
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3409
    Shell Resolution(Low) 5.4638
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 1579
    R-Factor(R-Work) 0.1712
    R-Factor(R-Free) 0.2357
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4638
    Shell Resolution(Low) 30.3219
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1629
    R-Factor(R-Work) 0.1886
    R-Factor(R-Free) 0.2339
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.084
    f_dihedral_angle_d 18.899
    f_angle_d 1.273
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2653
    Nucleic Acid Atoms 372
    Heterogen Atoms 4
    Solvent Atoms 127
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALA
    Structure Solution Molecular Replacement
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building Molecular version: Replacement
    data collection HKL-2000