X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 296.0
Details PEG 3350, NaCl, Glycerol, Cacodylate, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 296K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 56.78 α = 90
b = 77.11 β = 90
c = 116.65 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR CCD 165 mm -- 2011-07-19
Diffraction Radiation
Monochromator Protocol
Single crystal bender SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4C 0.97907 NSLS X4C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.25 17.02 95.7 -- -- -- 4.8 26316 25465 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.25 2.32 94.7 -- -- 2.03 4.2 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.25 17.018 -- 0.07 20979 20979 954 -- 0.22 0.2129 0.2114 0.2427 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3684 2.5163 -- 114 2644 0.303 0.3804 -- 79.0
X Ray Diffraction 2.5163 2.7099 -- 142 2907 0.2735 0.3467 -- 87.0
X Ray Diffraction 2.7099 2.9813 -- 143 3104 0.2504 0.3038 -- 92.0
X Ray Diffraction 2.9813 3.4096 -- 146 3212 0.2172 0.2478 -- 95.0
X Ray Diffraction 3.4096 4.2844 -- 161 3229 0.1889 0.1967 -- 94.0
X Ray Diffraction 4.2844 17.018 -- 176 3512 0.1726 0.2073 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 21.8261
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 37.56
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 24.3896
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.084
f_dihedral_angle_d 18.769
f_angle_d 1.325
f_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2633
Nucleic Acid Atoms 392
Heterogen Atoms 12
Solvent Atoms 356

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
PHENIX (phenix.refine: 1.7.2_869) Structure Solution
PHENIX (phenix.refine: 1.7.2_869) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.2_869) refinement
PHENIX version: (phenix.refine: 1.7.2_869) model building
HKL-2000 data collection