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X-RAY DIFFRACTION
Materials and Methods page
3V7A
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.5
    Temperature 298.0
    Details 40% v/v PEG 400, 5% w/v PEG 3350, and 0.1 M acetic acid pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 298.0K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 145.48 α = 90
    b = 145.48 β = 90
    c = 216.33 γ = 90
     
    Space Group
    Space Group Name:    P 43 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 298
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2010-08-10
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 3.3
    Resolution(Low) 31.54
    Number Reflections(All) 85009
    Number Reflections(Observed) 30833
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.297
    Resolution(Low) 31.537
    Cut-off Sigma(F) 1.0
    Number of Reflections(all) 85009
    Number of Reflections(Observed) 30833
    Number of Reflections(R-Free) 1532
    Percent Reflections(Observed) 86.38
    R-Factor(Observed) 0.2295
    R-Work 0.2268
    R-Free 0.2826
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 5.8221
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 5.8221
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -11.6441
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2973
    Shell Resolution(Low) 3.4036
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.3487
    R-Factor(R-Free) 0.4315
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4036
    Shell Resolution(Low) 3.5251
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2695
    R-Factor(R-Work) 0.3248
    R-Factor(R-Free) 0.3898
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5251
    Shell Resolution(Low) 3.666
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2700
    R-Factor(R-Work) 0.2876
    R-Factor(R-Free) 0.3503
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.666
    Shell Resolution(Low) 3.8326
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.2591
    R-Factor(R-Free) 0.3302
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8326
    Shell Resolution(Low) 4.0343
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.2414
    R-Factor(R-Free) 0.3227
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0343
    Shell Resolution(Low) 4.2865
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2633
    R-Factor(R-Work) 0.2029
    R-Factor(R-Free) 0.2591
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2865
    Shell Resolution(Low) 4.6165
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.1907
    R-Factor(R-Free) 0.1988
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6165
    Shell Resolution(Low) 5.0793
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.1816
    R-Factor(R-Free) 0.2708
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0793
    Shell Resolution(Low) 5.8104
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2689
    R-Factor(R-Work) 0.2035
    R-Factor(R-Free) 0.2832
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8104
    Shell Resolution(Low) 7.3054
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2695
    R-Factor(R-Work) 0.1975
    R-Factor(R-Free) 0.2384
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.3054
    Shell Resolution(Low) 31.5381
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2603
    R-Factor(R-Work) 0.2057
    R-Factor(R-Free) 0.2581
    Percent Reflections(Observed) 79.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.054
    f_dihedral_angle_d 12.842
    f_angle_d 0.795
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 11459
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution PHASES
    Structure Refinement PHENIX (phenix.refine: dev_755)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_755)
    model building PHASES
    data collection HKL-2000