X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.5
Temperature 298.0
Details 40% v/v PEG 400, 5% w/v PEG 3350, and 0.1 M acetic acid pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 298.0K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 145.48 α = 90
b = 145.48 β = 90
c = 216.33 γ = 90
Symmetry
Space Group P 43 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 298
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD -- 2010-08-10
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM 1 APS 22-BM

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.3 31.54 -- -- -- -- -- 85009 30833 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.297 31.537 -- 1.0 85009 30833 1532 86.38 -- 0.2295 0.2268 0.2826 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.2973 3.4036 -- 118 2643 0.3487 0.4315 -- 87.0
X Ray Diffraction 3.4036 3.5251 -- 133 2695 0.3248 0.3898 -- 89.0
X Ray Diffraction 3.5251 3.666 -- 138 2700 0.2876 0.3503 -- 89.0
X Ray Diffraction 3.666 3.8326 -- 131 2693 0.2591 0.3302 -- 88.0
X Ray Diffraction 3.8326 4.0343 -- 151 2693 0.2414 0.3227 -- 89.0
X Ray Diffraction 4.0343 4.2865 -- 152 2633 0.2029 0.2591 -- 87.0
X Ray Diffraction 4.2865 4.6165 -- 135 2614 0.1907 0.1988 -- 86.0
X Ray Diffraction 4.6165 5.0793 -- 137 2643 0.1816 0.2708 -- 85.0
X Ray Diffraction 5.0793 5.8104 -- 153 2689 0.2035 0.2832 -- 87.0
X Ray Diffraction 5.8104 7.3054 -- 152 2695 0.1975 0.2384 -- 86.0
X Ray Diffraction 7.3054 31.5381 -- 132 2603 0.2057 0.2581 -- 79.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 5.8221
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 5.8221
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -11.6441
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_chiral_restr 0.054
f_dihedral_angle_d 12.842
f_angle_d 0.795
f_bond_d 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 11459
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 0

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
PHASES Structure Solution
PHENIX (phenix.refine: dev_755) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: dev_755) refinement
PHASES model building
HKL-2000 data collection