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X-RAY DIFFRACTION
Materials and Methods page
3V3O
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.6
    Temperature 283.15
    Details Ammonium Sulfate, pH 8.6, VAPOR DIFFUSION, SITTING DROP, temperature 283.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 68.13 α = 111.02
    b = 80.08 β = 89.97
    c = 87.24 γ = 92.97
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type NOIR-1
    Collection Date 2011-05-13
     
    Diffraction Radiation
    Monochromator Rosenbaum-Rock Si (111) sagitally focused monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 4.2.2
    Wavelength List 1.00004
    Site ALS
    Beamline 4.2.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.06
    Resolution(High) 2.9
    Resolution(Low) 48.94
    Number Reflections(Observed) 37001
    Percent Possible(Observed) 96.74
    R Merge I(Observed) 0.11
    Redundancy 1.8
     
    High Resolution Shell Details
    Resolution(High) 2.9
    Resolution(Low) 2.96
    Percent Possible(All) 89.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.9
    Resolution(Low) 48.945
    Cut-off Sigma(F) 0.08
    Number of Reflections(Observed) 35593
    Number of Reflections(R-Free) 1749
    Percent Reflections(Observed) 93.4
    R-Factor(Observed) 0.2351
    R-Work 0.2317
    R-Free 0.2975
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 8.8532
    Anisotropic B[1][2] -3.1327
    Anisotropic B[1][3] 1.9249
    Anisotropic B[2][2] 5.6776
    Anisotropic B[2][3] 7.1585
    Anisotropic B[3][3] -14.5308
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9
    Shell Resolution(Low) 2.9853
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2429
    R-Factor(R-Work) 0.2624
    R-Factor(R-Free) 0.349
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9853
    Shell Resolution(Low) 3.0817
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.2635
    R-Factor(R-Free) 0.3275
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0817
    Shell Resolution(Low) 3.1918
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2723
    R-Factor(R-Work) 0.2646
    R-Factor(R-Free) 0.369
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1918
    Shell Resolution(Low) 3.3196
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2848
    R-Factor(R-Work) 0.2594
    R-Factor(R-Free) 0.3724
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3196
    Shell Resolution(Low) 3.4706
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2878
    R-Factor(R-Work) 0.2481
    R-Factor(R-Free) 0.3501
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4706
    Shell Resolution(Low) 3.6535
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2850
    R-Factor(R-Work) 0.2335
    R-Factor(R-Free) 0.3225
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6535
    Shell Resolution(Low) 3.8824
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2821
    R-Factor(R-Work) 0.2307
    R-Factor(R-Free) 0.2918
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8824
    Shell Resolution(Low) 4.182
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2891
    R-Factor(R-Work) 0.2265
    R-Factor(R-Free) 0.2968
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.182
    Shell Resolution(Low) 4.6025
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2949
    R-Factor(R-Work) 0.2096
    R-Factor(R-Free) 0.284
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6025
    Shell Resolution(Low) 5.2679
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2924
    R-Factor(R-Work) 0.214
    R-Factor(R-Free) 0.2712
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2679
    Shell Resolution(Low) 6.6343
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2926
    R-Factor(R-Work) 0.2372
    R-Factor(R-Free) 0.3021
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.6343
    Shell Resolution(Low) 48.9522
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2906
    R-Factor(R-Work) 0.2231
    R-Factor(R-Free) 0.2436
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.113
    f_dihedral_angle_d 17.504
    f_angle_d 1.543
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 11513
    Nucleic Acid Atoms 0
    Heterogen Atoms 410
    Solvent Atoms 23
     
     
  •   Software and Computing Hide
    Computing
    Data Collection EPICS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    data reduction HKL