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X-RAY DIFFRACTION
Materials and Methods page
3V3N
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.6
    Temperature 283.15
    Details Ammonium Sulafate, pH 8.6, VAPOR DIFFUSION, SITTING DROP, temperature 283.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 68.43 α = 111.11
    b = 80.1 β = 90.1
    c = 87.36 γ = 93.01
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type NOIR-1
    Details Rosenbaum-Rock Si (111) sagitally focused monochromator
    Collection Date 2011-05-13
     
    Diffraction Radiation
    Monochromator Rosenbaum-Rock Si (111) sagitally focused monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 4.2.2
    Wavelength List 1.00004
    Site ALS
    Beamline 4.2.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.7
    Resolution(Low) 50
    Number Reflections(Observed) 43415
    Percent Possible(Observed) 93.0
    R Merge I(Observed) 0.074
    Redundancy 1.7
     
    High Resolution Shell Details
    Resolution(High) 2.703
    Resolution(Low) 2.77
    Percent Possible(All) 84.7
    R Merge I(Observed) 0.317
    Redundancy 1.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.703
    Resolution(Low) 49.297
    Cut-off Sigma(F) 0.06
    Number of Reflections(Observed) 41120
    Number of Reflections(R-Free) 1896
    Percent Reflections(Observed) 87.01
    R-Factor(Observed) 0.2233
    R-Work 0.2208
    R-Free 0.2757
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.5001
    Anisotropic B[1][2] -1.5437
    Anisotropic B[1][3] -0.0816
    Anisotropic B[2][2] 8.6507
    Anisotropic B[2][3] 9.3194
    Anisotropic B[3][3] -10.1508
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.703
    Shell Resolution(Low) 2.7706
    Number of Reflections(R-Free) 95
    Number of Reflections(R-Work) 1844
    R-Factor(R-Work) 0.3349
    R-Factor(R-Free) 0.4473
    Percent Reflections(Observed) 58.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7706
    Shell Resolution(Low) 2.8455
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 2552
    R-Factor(R-Work) 0.3068
    R-Factor(R-Free) 0.3905
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8455
    Shell Resolution(Low) 2.9292
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2594
    R-Factor(R-Work) 0.2895
    R-Factor(R-Free) 0.3528
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9292
    Shell Resolution(Low) 3.0237
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.2702
    R-Factor(R-Free) 0.3811
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0237
    Shell Resolution(Low) 3.1318
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2870
    R-Factor(R-Work) 0.2575
    R-Factor(R-Free) 0.2834
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1318
    Shell Resolution(Low) 3.2572
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2877
    R-Factor(R-Work) 0.2323
    R-Factor(R-Free) 0.3249
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2572
    Shell Resolution(Low) 3.4054
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2869
    R-Factor(R-Work) 0.2208
    R-Factor(R-Free) 0.2743
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4054
    Shell Resolution(Low) 3.5849
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2873
    R-Factor(R-Work) 0.2106
    R-Factor(R-Free) 0.2804
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5849
    Shell Resolution(Low) 3.8094
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2946
    R-Factor(R-Work) 0.2041
    R-Factor(R-Free) 0.2579
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8094
    Shell Resolution(Low) 4.1034
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2903
    R-Factor(R-Work) 0.1942
    R-Factor(R-Free) 0.234
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1034
    Shell Resolution(Low) 4.5161
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2930
    R-Factor(R-Work) 0.1764
    R-Factor(R-Free) 0.2208
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5161
    Shell Resolution(Low) 5.1689
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3011
    R-Factor(R-Work) 0.185
    R-Factor(R-Free) 0.2155
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1689
    Shell Resolution(Low) 6.5099
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 3114
    R-Factor(R-Work) 0.2163
    R-Factor(R-Free) 0.2847
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5099
    Shell Resolution(Low) 49.3051
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 3131
    R-Factor(R-Work) 0.2381
    R-Factor(R-Free) 0.2795
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.079
    f_dihedral_angle_d 18.418
    f_angle_d 1.235
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 11559
    Nucleic Acid Atoms 0
    Heterogen Atoms 384
    Solvent Atoms 150
     
     
  •   Software and Computing Hide
    Computing
    Data Collection EPICS
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    molecular replacement Phaser version: 2.3.0
    data reduction HKL