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X-RAY DIFFRACTION
Materials and Methods page
3V1W
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 59.08 α = 90
    b = 144.59 β = 90
    c = 110.96 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Detector
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.2.1
    Wavelength List 1.000
    Site ALS
    Beamline 8.2.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.91
    Resolution(Low) 44.01
    Number Reflections(Observed) 36850
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.908
    Resolution(Low) 38.95
    Cut-off Sigma(F) 0.16
    Number of Reflections(Observed) 36846
    Number of Reflections(R-Free) 1981
    Percent Reflections(Observed) 98.56
    R-Factor(Observed) 0.1736
    R-Work 0.1709
    R-Free 0.2216
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -3.9985
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.3285
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 2.67
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.908
    Shell Resolution(Low) 1.9557
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2284
    R-Factor(R-Work) 0.1795
    R-Factor(R-Free) 0.2529
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9557
    Shell Resolution(Low) 2.0086
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2442
    R-Factor(R-Work) 0.184
    R-Factor(R-Free) 0.2291
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0086
    Shell Resolution(Low) 2.0677
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2443
    R-Factor(R-Work) 0.1695
    R-Factor(R-Free) 0.2721
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0677
    Shell Resolution(Low) 2.1345
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2465
    R-Factor(R-Work) 0.173
    R-Factor(R-Free) 0.2388
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1345
    Shell Resolution(Low) 2.2107
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2465
    R-Factor(R-Work) 0.1673
    R-Factor(R-Free) 0.2579
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2107
    Shell Resolution(Low) 2.2992
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2469
    R-Factor(R-Work) 0.1799
    R-Factor(R-Free) 0.2392
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2992
    Shell Resolution(Low) 2.4039
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2464
    R-Factor(R-Work) 0.1707
    R-Factor(R-Free) 0.2306
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4039
    Shell Resolution(Low) 2.5306
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2506
    R-Factor(R-Work) 0.187
    R-Factor(R-Free) 0.2492
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5306
    Shell Resolution(Low) 2.6891
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2509
    R-Factor(R-Work) 0.1832
    R-Factor(R-Free) 0.2462
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6891
    Shell Resolution(Low) 2.8967
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2512
    R-Factor(R-Work) 0.188
    R-Factor(R-Free) 0.2614
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8967
    Shell Resolution(Low) 3.188
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2531
    R-Factor(R-Work) 0.1805
    R-Factor(R-Free) 0.1953
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.188
    Shell Resolution(Low) 3.6491
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2530
    R-Factor(R-Work) 0.1517
    R-Factor(R-Free) 0.2024
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6491
    Shell Resolution(Low) 4.5963
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2574
    R-Factor(R-Work) 0.1469
    R-Factor(R-Free) 0.1773
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5963
    Shell Resolution(Low) 38.9578
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.1727
    R-Factor(R-Free) 0.2257
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.082
    f_dihedral_angle_d 16.311
    f_angle_d 1.122
    f_bond_d 0.014
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2841
    Nucleic Acid Atoms 0
    Heterogen Atoms 58
    Solvent Atoms 514
     
     
  •   Software and Computing Hide
    Computing
    Structure Refinement PHENIX (phenix.refine: 1.6.1_357)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.1_357)