X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 293.0
Details 20% PEG 4000, 10% isopropanol, 0.10M Hepes , pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 85.35 α = 90
b = 58 β = 90
c = 61.72 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 120
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV++ -- 2011-02-09
Diffraction Radiation
Monochromator Protocol
Osmic VariMax SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.54 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.34 50 98.4 -- -- -- 6.2 13181 13395 0.0 -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.35 2.39 85.0 -- -- -- 4.1 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.34 47.97 -- -- 13181 12534 648 98.56 -- 0.18554 0.18202 0.25669 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.344 2.405 -- 41 769 0.3 0.375 -- 84.64
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 40.95
Anisotropic B[1][1] -3.4
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 2.51
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.89
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 4.007
r_scbond_it 2.451
r_mcangle_it 1.648
r_mcbond_it 0.87
r_gen_planes_refined 0.008
r_chiral_restr 0.111
r_dihedral_angle_4_deg 10.494
r_dihedral_angle_3_deg 17.196
r_dihedral_angle_2_deg 32.369
r_dihedral_angle_1_deg 6.928
r_angle_refined_deg 1.618
r_bond_refined_d 0.017
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.26
Luzzati Sigma A (Observed) 0.36
Luzzati Resolution Cutoff (Low) 5.0
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2431
Nucleic Acid Atoms 0
Heterogen Atoms 9
Solvent Atoms 156

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
REFMAC 5.5.0109 Structure Refinement
Software
Software Name Purpose
CNS version: 1.1 refinement
PHASER model building
HKL-2000 data collection