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X-RAY DIFFRACTION
Materials and Methods page
3V0Q
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 295.0
    Details 50 mM MOPS pH 7, 50-200 mM AMMONIUM SULFATE, 50 mM MnCl2, AND 6-9% PEG-3350 , VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 78.1 α = 90
    b = 153.67 β = 90
    c = 52.5 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details bent cylindrical mirror
    Collection Date 2011-02-28
     
    Diffraction Radiation
    Monochromator Single crystal Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength List 0.97917
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.8
    Resolution(Low) 20
    Number Reflections(All) 59555
    Number Reflections(Observed) 59045
    Percent Possible(Observed) 99.1
    R Merge I(Observed) 0.114
    B(Isotropic) From Wilson Plot 22.143
    Redundancy 5.2
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.9
    Percent Possible(All) 99.4
    R Merge I(Observed) 0.655
    Mean I Over Sigma(Observed) 2.45
    Redundancy 5.3
    Number Unique Reflections(All) 8789
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.8
    Resolution(Low) 19.937
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 58994
    Number of Reflections(R-Free) 1771
    Percent Reflections(Observed) 99.27
    R-Factor(Observed) 0.1524
    R-Work 0.1512
    R-Free 0.1906
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Isotropic Thermal Model Isotropic+tls
    Mean Isotropic B Value 17.0653
    Anisotropic B[1][1] -0.063
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.1133
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.1763
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8
    Shell Resolution(Low) 1.8487
    Number of Reflections(Observed) 4502
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 4367
    R-Factor(R-Work) 0.2303
    R-Factor(R-Free) 0.2783
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8487
    Shell Resolution(Low) 1.903
    Number of Reflections(Observed) 4447
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 4313
    R-Factor(R-Work) 0.2054
    R-Factor(R-Free) 0.2592
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.903
    Shell Resolution(Low) 1.9644
    Number of Reflections(Observed) 4501
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 4366
    R-Factor(R-Work) 0.1778
    R-Factor(R-Free) 0.2307
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9644
    Shell Resolution(Low) 2.0345
    Number of Reflections(Observed) 4508
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 4373
    R-Factor(R-Work) 0.1616
    R-Factor(R-Free) 0.1979
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0345
    Shell Resolution(Low) 2.1159
    Number of Reflections(Observed) 4505
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 4370
    R-Factor(R-Work) 0.1472
    R-Factor(R-Free) 0.1878
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1159
    Shell Resolution(Low) 2.2121
    Number of Reflections(Observed) 4500
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 4364
    R-Factor(R-Work) 0.1443
    R-Factor(R-Free) 0.1856
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2121
    Shell Resolution(Low) 2.3285
    Number of Reflections(Observed) 4521
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 4386
    R-Factor(R-Work) 0.1396
    R-Factor(R-Free) 0.1635
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3285
    Shell Resolution(Low) 2.4742
    Number of Reflections(Observed) 4560
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 4423
    R-Factor(R-Work) 0.1508
    R-Factor(R-Free) 0.2019
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4742
    Shell Resolution(Low) 2.6648
    Number of Reflections(Observed) 4550
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 4413
    R-Factor(R-Work) 0.1422
    R-Factor(R-Free) 0.2064
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6648
    Shell Resolution(Low) 2.9322
    Number of Reflections(Observed) 4563
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 4426
    R-Factor(R-Work) 0.1549
    R-Factor(R-Free) 0.1942
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9322
    Shell Resolution(Low) 3.3548
    Number of Reflections(Observed) 4559
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 4423
    R-Factor(R-Work) 0.1411
    R-Factor(R-Free) 0.1743
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3548
    Shell Resolution(Low) 4.2201
    Number of Reflections(Observed) 4582
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 4445
    R-Factor(R-Work) 0.1278
    R-Factor(R-Free) 0.1608
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2201
    Shell Resolution(Low) 19.938
    Number of Reflections(Observed) 4696
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4554
    R-Factor(R-Work) 0.1497
    R-Factor(R-Free) 0.1775
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 13.993
    f_plane_restr 0.006
    f_chiral_restr 0.083
    f_angle_d 1.208
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4868
    Nucleic Acid Atoms 0
    Heterogen Atoms 140
    Solvent Atoms 631
     
     
  •   Software and Computing Hide
    Computing
    Data Collection mxCuBE
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    molecular replacement Phaser version: 2.1.4
    data reduction Xscale