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X-RAY DIFFRACTION
Materials and Methods page
3V0O
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 295.0
    Details 50 mM MOPS pH 7, 50-200 mM AMMONIUM SULFATE, 50 mM MnCl2, AND 6-9% PEG-3350 , VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 74.23 α = 90
    b = 151.68 β = 90
    c = 52.18 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX-225
    Details mirrors
    Collection Date 2010-01-15
     
    Diffraction Radiation
    Monochromator Double Crystal Monochromator, Si-111 crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.1
    Wavelength List 0.91841
    Site BESSY
    Beamline 14.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.65
    Resolution(Low) 20
    Number Reflections(All) 71749
    Number Reflections(Observed) 70167
    Percent Possible(Observed) 97.8
    R Merge I(Observed) 0.076
    B(Isotropic) From Wilson Plot 26.606
    Redundancy 7.1
     
    High Resolution Shell Details
    Resolution(High) 1.65
    Resolution(Low) 1.8
    Percent Possible(All) 96.8
    R Merge I(Observed) 0.707
    Mean I Over Sigma(Observed) 2.91
    Redundancy 7.0
    Number Unique Reflections(All) 16243
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.65
    Resolution(Low) 19.664
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 70164
    Number of Reflections(R-Free) 2105
    Percent Reflections(Observed) 97.85
    R-Factor(Observed) 0.1584
    R-Work 0.1572
    R-Free 0.194
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Isotropic Thermal Model Isotropic+tls
    Mean Isotropic B Value 22.856
    Anisotropic B[1][1] -0.4352
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.1555
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.5906
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.65
    Shell Resolution(Low) 1.6883
    Number of Reflections(Observed) 4555
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 4421
    R-Factor(R-Work) 0.2241
    R-Factor(R-Free) 0.2429
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6883
    Shell Resolution(Low) 1.7305
    Number of Reflections(Observed) 4534
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 4398
    R-Factor(R-Work) 0.2103
    R-Factor(R-Free) 0.2579
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7305
    Shell Resolution(Low) 1.7773
    Number of Reflections(Observed) 4585
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4447
    R-Factor(R-Work) 0.1967
    R-Factor(R-Free) 0.2403
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7773
    Shell Resolution(Low) 1.8295
    Number of Reflections(Observed) 4612
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4474
    R-Factor(R-Work) 0.1856
    R-Factor(R-Free) 0.2154
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8295
    Shell Resolution(Low) 1.8886
    Number of Reflections(Observed) 4617
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 4478
    R-Factor(R-Work) 0.1645
    R-Factor(R-Free) 0.2093
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8886
    Shell Resolution(Low) 1.956
    Number of Reflections(Observed) 4604
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4466
    R-Factor(R-Work) 0.1612
    R-Factor(R-Free) 0.1887
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.956
    Shell Resolution(Low) 2.0342
    Number of Reflections(Observed) 4631
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 4492
    R-Factor(R-Work) 0.1544
    R-Factor(R-Free) 0.214
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0342
    Shell Resolution(Low) 2.1267
    Number of Reflections(Observed) 4643
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 4504
    R-Factor(R-Work) 0.1529
    R-Factor(R-Free) 0.2094
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1267
    Shell Resolution(Low) 2.2387
    Number of Reflections(Observed) 4671
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 4531
    R-Factor(R-Work) 0.1534
    R-Factor(R-Free) 0.1841
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2387
    Shell Resolution(Low) 2.3787
    Number of Reflections(Observed) 4669
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 4529
    R-Factor(R-Work) 0.1466
    R-Factor(R-Free) 0.204
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3787
    Shell Resolution(Low) 2.562
    Number of Reflections(Observed) 4727
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4585
    R-Factor(R-Work) 0.1547
    R-Factor(R-Free) 0.1932
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.562
    Shell Resolution(Low) 2.8192
    Number of Reflections(Observed) 4687
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4546
    R-Factor(R-Work) 0.1611
    R-Factor(R-Free) 0.2067
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8192
    Shell Resolution(Low) 3.2256
    Number of Reflections(Observed) 4788
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4645
    R-Factor(R-Work) 0.1645
    R-Factor(R-Free) 0.2015
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2256
    Shell Resolution(Low) 4.058
    Number of Reflections(Observed) 4802
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 4658
    R-Factor(R-Work) 0.1435
    R-Factor(R-Free) 0.1871
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.058
    Shell Resolution(Low) 19.6651
    Number of Reflections(Observed) 5037
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 4885
    R-Factor(R-Work) 0.1441
    R-Factor(R-Free) 0.158
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 15.595
    f_plane_restr 0.008
    f_chiral_restr 0.098
    f_angle_d 1.437
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4706
    Nucleic Acid Atoms 0
    Heterogen Atoms 131
    Solvent Atoms 469
     
     
  •   Software and Computing Hide
    Computing
    Data Collection mxCuBE
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    molecular replacement Phaser version: 2.1.4
    data reduction Xscale