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X-RAY DIFFRACTION
Materials and Methods page
3V0L
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 295.0
    Details 50 mM MOPS pH 7, 50-200 mM AMMONIUM SULFATE, 50 mM MnCl2, AND 6-9% PEG-3350, VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 52.43 α = 90
    b = 148.58 β = 90
    c = 78.8 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
    Details Multilayer mirror, curved to focus in the vertical (R = 400 m)
    Collection Date 2009-05-29
     
    Diffraction Radiation
    Monochromator Bent silicon crystal, horizontally focusing (R = 12 m). Will be planar diamond monochromator.
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-5
    Wavelength List 0.90772
    Site MAX II
    Beamline I911-5
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.75
    Resolution(Low) 20
    Number Reflections(All) 31515
    Number Reflections(Observed) 31474
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.094
    B(Isotropic) From Wilson Plot 25.46
    Redundancy 7.3
     
    High Resolution Shell Details
    Resolution(High) 1.75
    Resolution(Low) 1.85
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.65
    Mean I Over Sigma(Observed) 3.27
    Redundancy 7.4
    Number Unique Reflections(All) 4740
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.75
    Resolution(Low) 19.7
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 31450
    Number of Reflections(R-Free) 945
    Percent Reflections(Observed) 99.97
    R-Factor(Observed) 0.1481
    R-Work 0.1471
    R-Free 0.1777
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Isotropic Thermal Model Isotropic+tls
    Mean Isotropic B Value 21.896
    Anisotropic B[1][1] -0.0291
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0185
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0105
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.75
    Shell Resolution(Low) 1.8422
    Number of Reflections(Observed) 4388
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 4256
    R-Factor(R-Work) 0.2043
    R-Factor(R-Free) 0.2699
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8422
    Shell Resolution(Low) 1.9576
    Number of Reflections(Observed) 4470
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 4336
    R-Factor(R-Work) 0.1574
    R-Factor(R-Free) 0.1712
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9576
    Shell Resolution(Low) 2.1085
    Number of Reflections(Observed) 4440
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 4307
    R-Factor(R-Work) 0.1331
    R-Factor(R-Free) 0.1726
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1085
    Shell Resolution(Low) 2.3204
    Number of Reflections(Observed) 4476
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 4341
    R-Factor(R-Work) 0.1314
    R-Factor(R-Free) 0.161
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3204
    Shell Resolution(Low) 2.6555
    Number of Reflections(Observed) 4467
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 4333
    R-Factor(R-Work) 0.1379
    R-Factor(R-Free) 0.1981
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6555
    Shell Resolution(Low) 3.343
    Number of Reflections(Observed) 4520
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 4384
    R-Factor(R-Work) 0.1521
    R-Factor(R-Free) 0.1859
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.343
    Shell Resolution(Low) 19.7012
    Number of Reflections(Observed) 4689
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4548
    R-Factor(R-Work) 0.1455
    R-Factor(R-Free) 0.1591
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 13.784
    f_plane_restr 0.011
    f_chiral_restr 0.151
    f_angle_d 1.884
    f_bond_d 0.021
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2276
    Nucleic Acid Atoms 0
    Heterogen Atoms 48
    Solvent Atoms 205
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MARCCD
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    molecular replacement Phaser version: 1.3.3
    data reduction Xscale