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X-RAY DIFFRACTION
Materials and Methods page
3UXP
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 296.0
    Details Peg3350, NaCl, Glycerol, Cacodylate, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 296K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 100.32 α = 90
    b = 56.61 β = 102.04
    c = 93.14 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2011-09-14
     
    Diffraction Radiation
    Monochromator Monochromator: Double silicon(111) crystal monochromator with cryogenically-cooled first crystal and sagittally-bent second crystal horizontally-focusing at 3.3:1 demagnification. Mirror: Meridionally-bent fused silica mirror with palladium and uncoated stripes vertically-focusing at 6.6:1 demagnification.
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 1.1
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.72
    Resolution(Low) 27.19
    Number Reflections(Observed) 25030
    Percent Possible(Observed) 90.08
     
    High Resolution Shell Details
    Resolution(High) 2.7226
    Resolution(Low) 2.7907
    Percent Possible(All) 66.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.723
    Resolution(Low) 27.195
    Cut-off Sigma(F) 0.09
    Number of Reflections(Observed) 25030
    Number of Reflections(R-Free) 2008
    Percent Reflections(Observed) 90.08
    R-Factor(All) 0.24
    R-Factor(Observed) 0.2248
    R-Work 0.2182
    R-Free 0.292
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -10.8835
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 2.5565
    Anisotropic B[2][2] -13.1072
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 23.9908
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7226
    Shell Resolution(Low) 2.7907
    Number of Reflections(R-Free) 102
    Number of Reflections(R-Work) 1202
    R-Factor(R-Work) 0.3514
    R-Factor(R-Free) 0.4549
    Percent Reflections(Observed) 66.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7907
    Shell Resolution(Low) 2.866
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 1426
    R-Factor(R-Work) 0.3488
    R-Factor(R-Free) 0.3993
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.866
    Shell Resolution(Low) 2.9503
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1403
    R-Factor(R-Work) 0.3267
    R-Factor(R-Free) 0.4363
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9503
    Shell Resolution(Low) 3.0454
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 1466
    R-Factor(R-Work) 0.3102
    R-Factor(R-Free) 0.3776
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0454
    Shell Resolution(Low) 3.1541
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1563
    R-Factor(R-Work) 0.282
    R-Factor(R-Free) 0.3729
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1541
    Shell Resolution(Low) 3.2801
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1673
    R-Factor(R-Work) 0.2643
    R-Factor(R-Free) 0.327
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2801
    Shell Resolution(Low) 3.4292
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1655
    R-Factor(R-Work) 0.2623
    R-Factor(R-Free) 0.3475
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4292
    Shell Resolution(Low) 3.6096
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1747
    R-Factor(R-Work) 0.2587
    R-Factor(R-Free) 0.3828
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6096
    Shell Resolution(Low) 3.8351
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1753
    R-Factor(R-Work) 0.2244
    R-Factor(R-Free) 0.3205
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8351
    Shell Resolution(Low) 4.1303
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1763
    R-Factor(R-Work) 0.1834
    R-Factor(R-Free) 0.299
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1303
    Shell Resolution(Low) 4.5442
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 1815
    R-Factor(R-Work) 0.1614
    R-Factor(R-Free) 0.2436
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5442
    Shell Resolution(Low) 5.1978
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 1824
    R-Factor(R-Work) 0.1708
    R-Factor(R-Free) 0.2482
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1978
    Shell Resolution(Low) 6.5337
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 1817
    R-Factor(R-Work) 0.2073
    R-Factor(R-Free) 0.2825
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5337
    Shell Resolution(Low) 27.1959
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 1915
    R-Factor(R-Work) 0.1994
    R-Factor(R-Free) 0.2587
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.096
    f_dihedral_angle_d 21.693
    f_angle_d 1.479
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5248
    Nucleic Acid Atoms 624
    Heterogen Atoms 63
    Solvent Atoms 41
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building Phaser
    data collection CBASS