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X-RAY DIFFRACTION
Materials and Methods page
3UXO
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 296.0
    Details PEG 3350, MES, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 296K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 77.91 α = 90
    b = 67.4 β = 115.81
    c = 82.46 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2010-08-04
     
    Diffraction Radiation
    Monochromator Cryogenically cooled double crystal monochromator with horizontal focusing sagittal bend second monocrystal with 4:1 magnification ratio and vertically focusing mirror
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.075
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.08
    Resolution(Low) 48.59
    Number Reflections(All) 45730
    Number Reflections(Observed) 45730
    Percent Possible(Observed) 99.5
     
    High Resolution Shell Details
    Resolution(High) 2.08
    Resolution(Low) 2.19
    Percent Possible(All) 99.7
    R Merge I(Observed) 0.594
    Mean I Over Sigma(Observed) 1.3
    R-Sym I(Observed) 0.594
    Redundancy 3.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.1
    Resolution(Low) 24.046
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 44844
    Number of Reflections(R-Free) 1996
    Percent Reflections(Observed) 99.58
    R-Factor(Observed) 0.2601
    R-Work 0.2573
    R-Free 0.318
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -7.2666
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.1449
    Anisotropic B[2][2] -4.237
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 11.5035
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1
    Shell Resolution(Low) 2.1528
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2981
    R-Factor(R-Work) 0.2962
    R-Factor(R-Free) 0.347
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1528
    Shell Resolution(Low) 2.211
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3045
    R-Factor(R-Work) 0.3066
    R-Factor(R-Free) 0.4
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.211
    Shell Resolution(Low) 2.276
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 3041
    R-Factor(R-Work) 0.3556
    R-Factor(R-Free) 0.4338
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.276
    Shell Resolution(Low) 2.3494
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 3046
    R-Factor(R-Work) 0.324
    R-Factor(R-Free) 0.3961
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3494
    Shell Resolution(Low) 2.4333
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3089
    R-Factor(R-Work) 0.2715
    R-Factor(R-Free) 0.3379
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4333
    Shell Resolution(Low) 2.5306
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 3039
    R-Factor(R-Work) 0.2712
    R-Factor(R-Free) 0.3232
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5306
    Shell Resolution(Low) 2.6456
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 3076
    R-Factor(R-Work) 0.2828
    R-Factor(R-Free) 0.3483
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6456
    Shell Resolution(Low) 2.7849
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3077
    R-Factor(R-Work) 0.269
    R-Factor(R-Free) 0.3526
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7849
    Shell Resolution(Low) 2.9591
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3049
    R-Factor(R-Work) 0.2653
    R-Factor(R-Free) 0.2977
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9591
    Shell Resolution(Low) 3.1871
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3074
    R-Factor(R-Work) 0.2628
    R-Factor(R-Free) 0.3343
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1871
    Shell Resolution(Low) 3.507
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 3069
    R-Factor(R-Work) 0.2617
    R-Factor(R-Free) 0.3225
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.507
    Shell Resolution(Low) 4.0124
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 3093
    R-Factor(R-Work) 0.2365
    R-Factor(R-Free) 0.3367
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0124
    Shell Resolution(Low) 5.0475
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3108
    R-Factor(R-Work) 0.2209
    R-Factor(R-Free) 0.2818
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0475
    Shell Resolution(Low) 24.0479
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3061
    R-Factor(R-Work) 0.2467
    R-Factor(R-Free) 0.2643
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.084
    f_dihedral_angle_d 19.724
    f_angle_d 1.195
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5222
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 266
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER: molecular replacement
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.2_432)
    model building PHASER: version: molecular replacement
    data collection CBASS