X-RAY DIFFRACTION Experimental Data & Validation


Lost? View more X-Ray Crystallographic info.

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7
Temperature 296.0
Details PEG 3350, MES, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 296K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 77.95 α = 90
b = 67.45 β = 116.14
c = 83.36 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RIGAKU RAXIS -- 2008-04-08
Diffraction Radiation
Monochromator Protocol
Osmic Mirrors SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 15 83.93 -- -- -- -- -- 22615 1.0 1.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.5 2.5674 77.0 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.5 15.002 -- 0.07 -- 22615 1815 83.93 0.2521 0.2554 0.25 0.3166 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5 2.5674 -- 141 1437 0.3405 0.4201 -- 77.0
X Ray Diffraction 2.5674 2.6425 -- 120 1545 0.3019 0.3851 -- 81.0
X Ray Diffraction 2.6425 2.7273 -- 141 1567 0.2911 0.3357 -- 83.0
X Ray Diffraction 2.7273 2.8242 -- 140 1658 0.2532 0.3397 -- 87.0
X Ray Diffraction 2.8242 2.9365 -- 142 1686 0.2626 0.377 -- 88.0
X Ray Diffraction 2.9365 3.069 -- 156 1674 0.2593 0.3268 -- 89.0
X Ray Diffraction 3.069 3.2293 -- 144 1688 0.2496 0.3669 -- 89.0
X Ray Diffraction 3.2293 3.4294 -- 151 1660 0.2659 0.3558 -- 88.0
X Ray Diffraction 3.4294 3.6905 -- 98 1132 0.3715 0.4389 -- 59.0
X Ray Diffraction 3.6905 4.0552 -- 113 1399 0.2795 0.3166 -- 73.0
X Ray Diffraction 4.0552 4.6269 -- 158 1780 0.1904 0.2562 -- 93.0
X Ray Diffraction 4.6269 5.7736 -- 155 1793 0.205 0.2548 -- 93.0
X Ray Diffraction 5.7736 15.0023 -- 156 1781 0.1793 0.228 -- 91.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -3.1587
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.3356
Anisotropic B[2][2] -3.5404
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 6.6991
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.08
f_dihedral_angle_d 18.3
f_angle_d 1.271
f_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5220
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 159

Software

Computing
Computing Package Purpose
d*TREK Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHENIX Structure Solution
PHENIX (phenix.refine: 1.6.2_432) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.6.2_432) refinement
PHENIX model building
d*TREK data collection