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X-RAY DIFFRACTION
Materials and Methods page
3UVI
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.8
    Temperature 291.0
    Details Sodium iodide 0.2M, PEG 3350 20% w/v, pH 7.8, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 91.02 α = 90
    b = 64.98 β = 95.6
    c = 70.49 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details MIRROR
    Collection Date 2011-03-16
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL MONOCHROMATOR
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength List 0.91841
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.55
    Resolution(Low) 50
    Number Reflections(All) 58805
    Number Reflections(Observed) 58805
    Percent Possible(Observed) 99.0
    B(Isotropic) From Wilson Plot 10.68
    Redundancy 3.0
     
    High Resolution Shell Details
    Resolution(High) 1.55
    Resolution(Low) 1.58
    Percent Possible(All) 89.7
    Mean I Over Sigma(Observed) 2.78
    R-Sym I(Observed) 0.274
    Redundancy 2.2
    Number Unique Reflections(All) 2729
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.55
    Resolution(Low) 35.076
    Cut-off Sigma(F) 1.36
    Number of Reflections(all) 58805
    Number of Reflections(Observed) 58746
    Number of Reflections(R-Free) 2970
    Percent Reflections(Observed) 98.83
    R-Factor(All) 0.166
    R-Factor(Observed) 0.166
    R-Work 0.1647
    R-Free 0.1907
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model isotropic
    Mean Isotropic B Value 12.47
    Anisotropic B[1][1] 1.8851
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -1.1094
    Anisotropic B[2][2] -0.5744
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.3107
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5496
    Shell Resolution(Low) 1.575
    Number of Reflections(R-Free) 109
    Number of Reflections(R-Work) 2416
    R-Factor(R-Work) 0.2292
    R-Factor(R-Free) 0.283
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.575
    Shell Resolution(Low) 1.6022
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.2144
    R-Factor(R-Free) 0.2435
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6022
    Shell Resolution(Low) 1.6313
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2628
    R-Factor(R-Work) 0.1972
    R-Factor(R-Free) 0.2271
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6313
    Shell Resolution(Low) 1.6627
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.1902
    R-Factor(R-Free) 0.214
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6627
    Shell Resolution(Low) 1.6966
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.1804
    R-Factor(R-Free) 0.2161
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6966
    Shell Resolution(Low) 1.7335
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.1726
    R-Factor(R-Free) 0.2025
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7335
    Shell Resolution(Low) 1.7738
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.1714
    R-Factor(R-Free) 0.2113
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7738
    Shell Resolution(Low) 1.8182
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2672
    R-Factor(R-Work) 0.1641
    R-Factor(R-Free) 0.2294
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8182
    Shell Resolution(Low) 1.8673
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2709
    R-Factor(R-Work) 0.1614
    R-Factor(R-Free) 0.1641
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8673
    Shell Resolution(Low) 1.9223
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.1634
    R-Factor(R-Free) 0.1869
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9223
    Shell Resolution(Low) 1.9843
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2637
    R-Factor(R-Work) 0.1602
    R-Factor(R-Free) 0.1823
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9843
    Shell Resolution(Low) 2.0552
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.1685
    R-Factor(R-Free) 0.1879
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0552
    Shell Resolution(Low) 2.1375
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.171
    R-Factor(R-Free) 0.2064
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1375
    Shell Resolution(Low) 2.2348
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.1606
    R-Factor(R-Free) 0.1955
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2348
    Shell Resolution(Low) 2.3526
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.1601
    R-Factor(R-Free) 0.1651
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3526
    Shell Resolution(Low) 2.4999
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2687
    R-Factor(R-Work) 0.1569
    R-Factor(R-Free) 0.1934
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4999
    Shell Resolution(Low) 2.6929
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2684
    R-Factor(R-Work) 0.1609
    R-Factor(R-Free) 0.2099
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6929
    Shell Resolution(Low) 2.9638
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2695
    R-Factor(R-Work) 0.167
    R-Factor(R-Free) 0.1691
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9638
    Shell Resolution(Low) 3.3923
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.1576
    R-Factor(R-Free) 0.1888
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3923
    Shell Resolution(Low) 4.2728
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.1421
    R-Factor(R-Free) 0.1617
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2728
    Shell Resolution(Low) 35.0848
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2645
    R-Factor(R-Work) 0.1693
    R-Factor(R-Free) 0.1935
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.07
    f_dihedral_angle_d 12.74
    f_angle_d 1.054
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2867
    Nucleic Acid Atoms 0
    Heterogen Atoms 39
    Solvent Atoms 479
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building PHASER
    data collection MAR345dtb