X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 293.0
Details PEG 3350, Proline, 1,6-hexanediol, HEPES, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 54.52 α = 90
b = 80.56 β = 90
c = 130.85 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RIGAKU -- 2011-07-07
CCD ADSC QUANTUM 315 -- 2011-05-17
Diffraction Radiation
Monochromator Protocol
360 frames, 0.5 degree oscillation SINGLE WAVELENGTH
360 frames, 1 degree oscillation SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SEALED TUBE RIGAKU MICROMAX-007 HF 1.5418 -- --
SYNCHROTRON SSRF BEAMLINE BL17U 0.9794 SSRF BL17U

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 65.37 98.59 0.057 -- -- 5.7 16315 16085 2.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.1 2.14 97.8 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.1 65.37 -- -- 16315 16085 859 98.59 -- 0.18586 0.18288 0.24079 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.101 2.156 -- 58 1142 0.173 0.259 -- 97.64
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 24.849
Anisotropic B[1][1] -1.46
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 1.25
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.21
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 3.288
r_scbond_it 2.317
r_mcangle_it 1.331
r_mcbond_it 1.071
r_symmetry_hbond_refined 0.129
r_bond_refined_d 0.014
r_angle_refined_deg 1.371
r_dihedral_angle_1_deg 5.217
r_dihedral_angle_2_deg 37.978
r_dihedral_angle_3_deg 14.435
r_dihedral_angle_4_deg 18.032
r_chiral_restr 0.093
r_gen_planes_refined 0.006
r_nbd_refined 0.211
r_nbtor_refined 0.305
r_xyhbond_nbd_refined 0.161
r_symmetry_vdw_refined 0.191
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2087
Nucleic Acid Atoms 0
Heterogen Atoms 53
Solvent Atoms 148

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
SHARP Structure Solution
REFMAC 5.2.0019 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.2.0019 refinement
SHARP model building
HKL-2000 data collection