X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 293.0
Details PEG 3350, Proline, 1,6-hexanediol, HEPES, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 54.52 α = 90
b = 80.56 β = 90
c = 130.85 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2011-05-17
IMAGE PLATE RIGAKU -- 2011-07-07
Diffraction Radiation
Monochromator Protocol
360 frames, 1 degree oscillation SINGLE WAVELENGTH
360 frames, 0.5 degree oscillation SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.9794 SSRF BL17U
SEALED TUBE RIGAKU MICROMAX-007 HF 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 65.37 98.59 0.057 -- -- 5.7 16315 16085 2.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.1 2.14 97.8 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.1 65.37 -- -- 16315 16085 859 98.59 -- 0.18586 0.18288 0.24079 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.101 2.156 -- 58 1142 0.173 0.259 -- 97.64
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 24.849
Anisotropic B[1][1] -1.46
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 1.25
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.21
RMS Deviations
Key Refinement Restraint Deviation
r_scbond_it 2.317
r_angle_refined_deg 1.371
r_symmetry_hbond_refined 0.129
r_dihedral_angle_4_deg 18.032
r_xyhbond_nbd_refined 0.161
r_symmetry_vdw_refined 0.191
r_dihedral_angle_2_deg 37.978
r_dihedral_angle_1_deg 5.217
r_nbd_refined 0.211
r_dihedral_angle_3_deg 14.435
r_bond_refined_d 0.014
r_nbtor_refined 0.305
r_mcbond_it 1.071
r_gen_planes_refined 0.006
r_chiral_restr 0.093
r_mcangle_it 1.331
r_scangle_it 3.288
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2087
Nucleic Acid Atoms 0
Heterogen Atoms 53
Solvent Atoms 148

Software

Software
Software Name Purpose
HKL-2000 data collection
SHARP phasing
REFMAC refinement version: 5.2.0019
HKL-2000 data reduction
HKL-2000 data scaling