X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 291.0
Details 0.1M MES pH 6.5, 1M LiSO4, VAPOR DIFFUSION, HANGING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 300.24 α = 90
b = 300.24 β = 90
c = 78.34 γ = 90
Symmetry
Space Group I 41 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2010-05-10
CCD ADSC QUANTUM 315r -- 2008-02-29
Diffraction Radiation
Monochromator Protocol
Si 111 CHANNEL Single wavelength
Si 111 CHANNEL SAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.9796 SOLEIL PROXIMA 1
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.9330 SOLEIL PROXIMA 1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 41.8 95.9 -- -- -- -- 49479 47450 0.0 0.0 67.24
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.7 2.8 92.4 -- 0.464 3.1 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.7 41.76 -- 0.0 48729 47388 2421 -- -- 0.2206 0.2193 0.2451 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.7 2.77 -- 180 3072 0.2591 0.3008 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 58.42
Anisotropic B[1][1] 2.1161
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 2.1161
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -4.2323
RMS Deviations
Key Refinement Restraint Deviation
t_bond_d 0.009
t_angle_deg 1.13
t_omega_torsion 2.46
t_other_torsion 21.25
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.402
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6542
Nucleic Acid Atoms 0
Heterogen Atoms 20
Solvent Atoms 165

Software

Computing
Computing Package Purpose
ADSC Quantum Data Collection
XDS Data Reduction (intensity integration)
XSCALE Data Reduction (data scaling)
SHELXS Structure Solution
BUSTER 2.8.0 Structure Refinement
Software
Software Name Purpose
BUSTER version: 2.8.0 refinement
SHELXS model building
ADSC version: Quantum data collection