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X-RAY DIFFRACTION
Materials and Methods page
3UQP
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, hanging drop
    pH 7.5
    Temperature 293.0
    Details 1.7M Li2SO4, 100mM HEPES, pH 7.5, vapor diffusion, hanging drop, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 104.39 α = 90
    b = 128.06 β = 90
    c = 76.17 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2011-07-21
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.97915
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.77
    Resolution(Low) 40.46
    Number Reflections(All) 43837
    Number Reflections(Observed) 43705
    Percent Possible(Observed) 87.4
    R Merge I(Observed) 0.081
    B(Isotropic) From Wilson Plot 15.47
     
    High Resolution Shell Details
    Resolution(High) 1.77
    Resolution(Low) 1.82
    Percent Possible(All) 92.0
    R Merge I(Observed) 0.495
    Mean I Over Sigma(Observed) 2.82
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.77
    Resolution(Low) 40.456
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 43837
    Number of Reflections(Observed) 43704
    Number of Reflections(R-Free) 1312
    Percent Reflections(Observed) 87.36
    R-Factor(Observed) 0.1659
    R-Work 0.1652
    R-Free 0.1891
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 20.8433
    Anisotropic B[1][1] -5.2029
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 6.6785
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.4756
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.77
    Shell Resolution(Low) 1.8409
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 4910
    R-Factor(R-Work) 0.2238
    R-Factor(R-Free) 0.2746
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8409
    Shell Resolution(Low) 1.9247
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 4877
    R-Factor(R-Work) 0.1938
    R-Factor(R-Free) 0.2446
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9247
    Shell Resolution(Low) 2.0261
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 4807
    R-Factor(R-Work) 0.1692
    R-Factor(R-Free) 0.2018
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0261
    Shell Resolution(Low) 2.1531
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 4787
    R-Factor(R-Work) 0.1615
    R-Factor(R-Free) 0.2013
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1531
    Shell Resolution(Low) 2.3193
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 4748
    R-Factor(R-Work) 0.1572
    R-Factor(R-Free) 0.1846
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3193
    Shell Resolution(Low) 2.5527
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 4684
    R-Factor(R-Work) 0.158
    R-Factor(R-Free) 0.1836
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5527
    Shell Resolution(Low) 2.922
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4601
    R-Factor(R-Work) 0.1697
    R-Factor(R-Free) 0.1783
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.922
    Shell Resolution(Low) 3.681
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 4521
    R-Factor(R-Work) 0.1538
    R-Factor(R-Free) 0.1715
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.681
    Shell Resolution(Low) 40.467
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4457
    R-Factor(R-Work) 0.1581
    R-Factor(R-Free) 0.1722
    Percent Reflections(Observed) 79.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 14.081
    f_plane_restr 0.004
    f_chiral_restr 0.076
    f_angle_d 1.114
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3009
    Nucleic Acid Atoms 0
    Heterogen Atoms 10
    Solvent Atoms 352
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    data reduction Xscale