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X-RAY DIFFRACTION
Materials and Methods page
3UQ9
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    Temperature 293.0
    Details 100mM Bis-tris pH 6.1-6.7, 200mM LiSO4, 16-20% PEG 3350 , VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 59.56 α = 90
    b = 180.51 β = 90
    c = 78.55 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV++
    Details mirrors
    Collection Date 2011-02-11
     
    Diffraction Radiation
    Monochromator VariMax HF
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.34
    Resolution(Low) 20
    Number Reflections(All) 36510
    Number Reflections(Observed) 35262
    Percent Possible(Observed) 96.6
    R Merge I(Observed) 0.071
    B(Isotropic) From Wilson Plot 37.35
     
    High Resolution Shell Details
    Resolution(High) 2.34
    Resolution(Low) 2.48
    Percent Possible(All) 88.2
    R Merge I(Observed) 0.352
    Mean I Over Sigma(Observed) 2.38
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.343
    Resolution(Low) 19.638
    Cut-off Sigma(F) 1.99
    Number of Reflections(all) 36510
    Number of Reflections(Observed) 35239
    Number of Reflections(R-Free) 1764
    Percent Reflections(Observed) 96.79
    R-Factor(Observed) 0.1741
    R-Work 0.1713
    R-Free 0.2265
     
    Temperature Factor Modeling
    Mean Isotropic B Value 32.7556
    Anisotropic B[1][1] 7.6486
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -2.9689
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -4.6515
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3428
    Shell Resolution(Low) 2.4061
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 2145
    R-Factor(R-Work) 0.2265
    R-Factor(R-Free) 0.312
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4061
    Shell Resolution(Low) 2.4767
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2462
    R-Factor(R-Work) 0.2173
    R-Factor(R-Free) 0.2727
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4767
    Shell Resolution(Low) 2.5565
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2513
    R-Factor(R-Work) 0.2043
    R-Factor(R-Free) 0.2469
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5565
    Shell Resolution(Low) 2.6477
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2563
    R-Factor(R-Work) 0.1999
    R-Factor(R-Free) 0.266
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6477
    Shell Resolution(Low) 2.7534
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.1897
    R-Factor(R-Free) 0.2616
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7534
    Shell Resolution(Low) 2.8784
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.1963
    R-Factor(R-Free) 0.2525
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8784
    Shell Resolution(Low) 3.0296
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.1968
    R-Factor(R-Free) 0.2364
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0296
    Shell Resolution(Low) 3.2186
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2606
    R-Factor(R-Work) 0.1885
    R-Factor(R-Free) 0.2583
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2186
    Shell Resolution(Low) 3.4659
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.1671
    R-Factor(R-Free) 0.221
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4659
    Shell Resolution(Low) 3.8124
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.1562
    R-Factor(R-Free) 0.229
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8124
    Shell Resolution(Low) 4.3588
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2641
    R-Factor(R-Work) 0.1439
    R-Factor(R-Free) 0.175
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3588
    Shell Resolution(Low) 5.4719
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2676
    R-Factor(R-Work) 0.1337
    R-Factor(R-Free) 0.1935
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4719
    Shell Resolution(Low) 19.6387
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2688
    R-Factor(R-Work) 0.1685
    R-Factor(R-Free) 0.2061
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.056
    f_dihedral_angle_d 11.457
    f_angle_d 0.784
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5305
    Nucleic Acid Atoms 0
    Heterogen Atoms 59
    Solvent Atoms 324
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CrystalClear
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    density modification DM
    molecular replacement Phaser
    data reduction Xscale
    data collection D*trek