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X-RAY DIFFRACTION
Materials and Methods page
3UOF
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 298.0
    Details 1.7 M NaCl and 100 mM Tris-HCl (pH 8.0), VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 122.8 α = 90
    b = 122.8 β = 90
    c = 174.69 γ = 90
     
    Space Group
    Space Group Name:    I 4
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type ADSC QUANTUM 315
     
    Diffraction Radiation
    Monochromator double crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.2.2
    Wavelength List 0.9795
    Site ALS
    Beamline 8.2.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.9
    Resolution(Low) 50
    Number Reflections(All) 25472
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.18
    Redundancy 11.2
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 2.902
    Resolution(Low) 43.673
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 28404
    Number of Reflections(R-Free) 1489
    Percent Reflections(Observed) 99.32
    R-Factor(Observed) 0.2126
    R-Work 0.2078
    R-Free 0.2978
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.0866
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0866
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.1732
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9018
    Shell Resolution(Low) 3.0055
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.1933
    R-Factor(R-Free) 0.3028
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0055
    Shell Resolution(Low) 3.1258
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.194
    R-Factor(R-Free) 0.2888
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1258
    Shell Resolution(Low) 3.2681
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2683
    R-Factor(R-Work) 0.2001
    R-Factor(R-Free) 0.3275
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2681
    Shell Resolution(Low) 3.4403
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2709
    R-Factor(R-Work) 0.1946
    R-Factor(R-Free) 0.2999
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4403
    Shell Resolution(Low) 3.6557
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2669
    R-Factor(R-Work) 0.2144
    R-Factor(R-Free) 0.3028
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6557
    Shell Resolution(Low) 3.9378
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.2124
    R-Factor(R-Free) 0.3609
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9378
    Shell Resolution(Low) 4.3338
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.207
    R-Factor(R-Free) 0.2837
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3338
    Shell Resolution(Low) 4.9602
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.1848
    R-Factor(R-Free) 0.2699
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9602
    Shell Resolution(Low) 6.2464
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.2076
    R-Factor(R-Free) 0.3053
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.2464
    Shell Resolution(Low) 43.6777
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.2104
    R-Factor(R-Free) 0.2424
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.068
    f_dihedral_angle_d 19.292
    f_angle_d 1.186
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7710
    Nucleic Acid Atoms 0
    Heterogen Atoms 165
    Solvent Atoms 89
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Refinement REFMAC 5.5.0109
     
    Software
    refinement REFMAC version: 5.5.0109
    data collection ADSC version: Quantum