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X-RAY DIFFRACTION
Materials and Methods page
3UNT
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.5
    Temperature 291.0
    Details TRIS 0.1M, DMSO 10% v/v, PEG8000 7% w/w, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 91.29 α = 90
    b = 64.89 β = 96.01
    c = 70.24 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details MIRROR
    Collection Date 2011-10-13
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL MONOCHROMATOR
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength List 0.91841
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.8
    Resolution(Low) 30
    Number Reflections(All) 36234
    Number Reflections(Observed) 36234
    Percent Possible(Observed) 95.7
    B(Isotropic) From Wilson Plot 14.7
    Redundancy 2.7
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.83
    Percent Possible(All) 87.5
    Mean I Over Sigma(Observed) 2.8
    R-Sym I(Observed) 0.283
    Redundancy 2.0
    Number Unique Reflections(All) 1618
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.801
    Resolution(Low) 18.917
    Cut-off Sigma(F) 1.36
    Number of Reflections(all) 36210
    Number of Reflections(Observed) 36210
    Number of Reflections(R-Free) 1796
    Percent Reflections(Observed) 95.67
    R-Factor(All) 0.1552
    R-Factor(Observed) 0.1552
    R-Work 0.1536
    R-Free 0.1847
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model isotropic
    Mean Isotropic B Value 17.7
    Anisotropic B[1][1] 2.7797
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.415
    Anisotropic B[2][2] -1.9215
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.8582
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8
    Shell Resolution(Low) 1.8491
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2421
    R-Factor(R-Work) 0.2034
    R-Factor(R-Free) 0.2456
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8491
    Shell Resolution(Low) 1.9035
    Number of Reflections(R-Free) 112
    Number of Reflections(R-Work) 2563
    R-Factor(R-Work) 0.1892
    R-Factor(R-Free) 0.2792
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9035
    Shell Resolution(Low) 1.9649
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2595
    R-Factor(R-Work) 0.1661
    R-Factor(R-Free) 0.2101
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9649
    Shell Resolution(Low) 2.035
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.1553
    R-Factor(R-Free) 0.2072
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.035
    Shell Resolution(Low) 2.1164
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.1566
    R-Factor(R-Free) 0.198
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1164
    Shell Resolution(Low) 2.2126
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2691
    R-Factor(R-Work) 0.1492
    R-Factor(R-Free) 0.1945
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2126
    Shell Resolution(Low) 2.3291
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2737
    R-Factor(R-Work) 0.1471
    R-Factor(R-Free) 0.1949
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3291
    Shell Resolution(Low) 2.4747
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.147
    R-Factor(R-Free) 0.1988
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4747
    Shell Resolution(Low) 2.6653
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2714
    R-Factor(R-Work) 0.1526
    R-Factor(R-Free) 0.1792
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6653
    Shell Resolution(Low) 2.9326
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2691
    R-Factor(R-Work) 0.1504
    R-Factor(R-Free) 0.1932
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9326
    Shell Resolution(Low) 3.3549
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2683
    R-Factor(R-Work) 0.1453
    R-Factor(R-Free) 0.1433
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3549
    Shell Resolution(Low) 4.2191
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2652
    R-Factor(R-Work) 0.1358
    R-Factor(R-Free) 0.1503
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2191
    Shell Resolution(Low) 18.9179
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2613
    R-Factor(R-Work) 0.1641
    R-Factor(R-Free) 0.1852
    Percent Reflections(Observed) 92.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.068
    f_dihedral_angle_d 12.527
    f_angle_d 1.036
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2838
    Nucleic Acid Atoms 0
    Heterogen Atoms 23
    Solvent Atoms 399
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building PHASER
    data collection MAR345dtb