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X-RAY DIFFRACTION
Materials and Methods page
3UMU
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 293.0
    Details 2.5 M sodium chloride, 0.1M imidazole, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 293.0K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 85.66 α = 90
    b = 86.68 β = 90
    c = 45.08 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Details mirrors
    Collection Date 2011-11-10
     
    Diffraction Radiation
    Monochromator monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.075
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.75
    Resolution(Low) 42.83
    Number Reflections(All) 33251
    Number Reflections(Observed) 33251
    Percent Possible(Observed) 96.03
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.75
    Resolution(Low) 42.831
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 33251
    Number of Reflections(Observed) 33251
    Number of Reflections(R-Free) 1682
    Percent Reflections(Observed) 96.03
    R-Factor(All) 0.156
    R-Factor(Observed) 0.156
    R-Work 0.1548
    R-Free 0.1794
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.5793
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.9791
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.5584
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.75
    Shell Resolution(Low) 1.8015
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2207
    R-Factor(R-Work) 0.18
    R-Factor(R-Free) 0.2224
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8015
    Shell Resolution(Low) 1.8597
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2421
    R-Factor(R-Work) 0.1651
    R-Factor(R-Free) 0.2178
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8597
    Shell Resolution(Low) 1.9261
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2575
    R-Factor(R-Work) 0.1526
    R-Factor(R-Free) 0.1915
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9261
    Shell Resolution(Low) 2.0032
    Number of Reflections(R-Free) 104
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.1475
    R-Factor(R-Free) 0.1845
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0032
    Shell Resolution(Low) 2.0944
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2682
    R-Factor(R-Work) 0.146
    R-Factor(R-Free) 0.1851
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0944
    Shell Resolution(Low) 2.2048
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.1452
    R-Factor(R-Free) 0.1749
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2048
    Shell Resolution(Low) 2.343
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.1519
    R-Factor(R-Free) 0.1717
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.343
    Shell Resolution(Low) 2.5238
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2705
    R-Factor(R-Work) 0.1506
    R-Factor(R-Free) 0.1708
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5238
    Shell Resolution(Low) 2.7778
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2715
    R-Factor(R-Work) 0.1723
    R-Factor(R-Free) 0.1747
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7778
    Shell Resolution(Low) 3.1796
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.1642
    R-Factor(R-Free) 0.1878
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1796
    Shell Resolution(Low) 4.0055
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.1421
    R-Factor(R-Free) 0.1633
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0055
    Shell Resolution(Low) 42.8433
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2760
    R-Factor(R-Work) 0.1578
    R-Factor(R-Free) 0.1792
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.075
    f_dihedral_angle_d 15.411
    f_angle_d 1.039
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2173
    Nucleic Acid Atoms 0
    Heterogen Atoms 57
    Solvent Atoms 234
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution BALBES
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building BALBES
    data collection CBASS