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X-RAY DIFFRACTION
Materials and Methods page
3UMT
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 9.5
    Temperature 298.0
    Details 1M Sodium citrate, 0.1 M CHES pH9.5 diluted by water 4:1, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 65.29 α = 90
    b = 65.29 β = 90
    c = 96.2 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2010-04-10
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-BM
    Wavelength List 0.97931
    Site APS
    Beamline 19-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.8
    Resolution(Low) 100
    Number Reflections(All) 22646
    Number Reflections(Observed) 22608
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.04
    B(Isotropic) From Wilson Plot 22.3
    Redundancy 12.0
     
    High Resolution Shell Details
    Resolution(High) 1.798
    Resolution(Low) 1.83
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.341
    Mean I Over Sigma(Observed) 6.4
    Redundancy 12.0
    Number Unique Reflections(All) 1095
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.798
    Resolution(Low) 30.914
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 22608
    Number of Reflections(Observed) 22528
    Number of Reflections(R-Free) 1153
    Percent Reflections(Observed) 99.65
    R-Factor(Observed) 0.1772
    R-Work 0.1748
    R-Free 0.2232
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.1573
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.1573
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.3146
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.798
    Shell Resolution(Low) 1.8803
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.1819
    R-Factor(R-Free) 0.2295
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8803
    Shell Resolution(Low) 1.9794
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2653
    R-Factor(R-Work) 0.1833
    R-Factor(R-Free) 0.2123
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9794
    Shell Resolution(Low) 2.1034
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.1808
    R-Factor(R-Free) 0.2329
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1034
    Shell Resolution(Low) 2.2658
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2641
    R-Factor(R-Work) 0.1729
    R-Factor(R-Free) 0.2399
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2658
    Shell Resolution(Low) 2.4937
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.1893
    R-Factor(R-Free) 0.231
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4937
    Shell Resolution(Low) 2.8543
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.1855
    R-Factor(R-Free) 0.2336
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8543
    Shell Resolution(Low) 3.5953
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.1715
    R-Factor(R-Free) 0.2345
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5953
    Shell Resolution(Low) 30.9182
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2817
    R-Factor(R-Work) 0.1657
    R-Factor(R-Free) 0.2043
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.009
    f_chiral_restr 0.118
    f_dihedral_angle_d 16.917
    f_angle_d 1.627
    f_bond_d 0.016
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1724
    Nucleic Acid Atoms 0
    Heterogen Atoms 13
    Solvent Atoms 203
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building Phaser
    data collection HKL-3000