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X-RAY DIFFRACTION
Materials and Methods page
3UL6
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.75
    Temperature 293.0
    Details 100mM HEPES, 200mM MgCl2, 25% PEG4000, pH 7.75, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 83.8 α = 90
    b = 83.8 β = 90
    c = 142.57 γ = 120
     
    Space Group
    Space Group Name:    P 64 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details Si(111)
    Collection Date 2008-06-26
     
    Diffraction Radiation
    Monochromator DCM Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type LNLS BEAMLINE W01B-MX2
    Wavelength List 1.45
    Site LNLS
    Beamline W01B-MX2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.63
    Resolution(Low) 50.1
    Number Reflections(All) 9392
    Number Reflections(Observed) 9139
    Percent Possible(Observed) 97.3
     
    High Resolution Shell Details
    Resolution(High) 2.63
    Percent Possible(All) 97.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.63
    Resolution(Low) 50.855
    Cut-off Sigma(F) 1.36
    Number of Reflections(all) 9392
    Number of Reflections(Observed) 9125
    Number of Reflections(R-Free) 436
    Percent Reflections(Observed) 97.6
    R-Factor(Observed) 0.2391
    R-Work 0.2386
    R-Free 0.2503
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 3.7314
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 3.7314
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -7.4629
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.63
    Shell Resolution(Low) 3.0106
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2767
    R-Factor(R-Work) 0.319
    R-Factor(R-Free) 0.3167
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0106
    Shell Resolution(Low) 3.7928
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2880
    R-Factor(R-Work) 0.2264
    R-Factor(R-Free) 0.2544
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7928
    Shell Resolution(Low) 50.8648
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 3042
    R-Factor(R-Work) 0.227
    R-Factor(R-Free) 0.2282
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.073
    f_dihedral_angle_d 18.203
    f_angle_d 1.115
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1218
    Nucleic Acid Atoms 0
    Heterogen Atoms 18
    Solvent Atoms 21
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 2011_09_22_2056)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    molecular replacement Phaser