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X-RAY DIFFRACTION
Materials and Methods page
3UL1
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.2
    Temperature 293.0
    Details 0.79M sodium citrate, 10mM DTT, 0.1M HEPES, pH 7.2, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 79.16 α = 90
    b = 90.09 β = 90
    c = 99.33 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RIGAKU SATURN 944
    Collection Date 2010-01-13
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU FR-E+ SUPERBRIGHT
    Wavelength List 1.5419
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.9
    Resolution(Low) 42.07
    Number Reflections(Observed) 55684
    Percent Possible(Observed) 98.3
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 1.97
    Percent Possible(All) 93.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.9
    Resolution(Low) 42.07
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 52372
    Number of Reflections(R-Free) 2659
    Percent Reflections(Observed) 92.46
    R-Factor(Observed) 0.193
    R-Work 0.1914
    R-Free 0.2224
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 39.9733
    Anisotropic B[1][1] -0.5476
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -7.176
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 7.7236
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 1.9346
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 2090
    R-Factor(R-Work) 0.3633
    R-Factor(R-Free) 0.4214
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9346
    Shell Resolution(Low) 1.9718
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2260
    R-Factor(R-Work) 0.3223
    R-Factor(R-Free) 0.363
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9718
    Shell Resolution(Low) 2.012
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2324
    R-Factor(R-Work) 0.2671
    R-Factor(R-Free) 0.3045
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.012
    Shell Resolution(Low) 2.0558
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2415
    R-Factor(R-Work) 0.2375
    R-Factor(R-Free) 0.2724
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0558
    Shell Resolution(Low) 2.1036
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2487
    R-Factor(R-Work) 0.2274
    R-Factor(R-Free) 0.2523
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1036
    Shell Resolution(Low) 2.1562
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2508
    R-Factor(R-Work) 0.2096
    R-Factor(R-Free) 0.2468
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1562
    Shell Resolution(Low) 2.2145
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2564
    R-Factor(R-Work) 0.211
    R-Factor(R-Free) 0.2375
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2145
    Shell Resolution(Low) 2.2797
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.2031
    R-Factor(R-Free) 0.2671
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2797
    Shell Resolution(Low) 2.3532
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.2065
    R-Factor(R-Free) 0.2406
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3532
    Shell Resolution(Low) 2.4373
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2623
    R-Factor(R-Work) 0.2083
    R-Factor(R-Free) 0.316
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4373
    Shell Resolution(Low) 2.5349
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2619
    R-Factor(R-Work) 0.1985
    R-Factor(R-Free) 0.2313
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5349
    Shell Resolution(Low) 2.6503
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.2096
    R-Factor(R-Free) 0.2621
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6503
    Shell Resolution(Low) 2.79
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2717
    R-Factor(R-Work) 0.2022
    R-Factor(R-Free) 0.2055
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.79
    Shell Resolution(Low) 2.9647
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2765
    R-Factor(R-Work) 0.199
    R-Factor(R-Free) 0.254
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9647
    Shell Resolution(Low) 3.1936
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2798
    R-Factor(R-Work) 0.1987
    R-Factor(R-Free) 0.221
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1936
    Shell Resolution(Low) 3.5148
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2827
    R-Factor(R-Work) 0.1934
    R-Factor(R-Free) 0.2498
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5148
    Shell Resolution(Low) 4.023
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2842
    R-Factor(R-Work) 0.1671
    R-Factor(R-Free) 0.1785
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.023
    Shell Resolution(Low) 5.0672
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2868
    R-Factor(R-Work) 0.1447
    R-Factor(R-Free) 0.1715
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0672
    Shell Resolution(Low) 42.0807
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 2996
    R-Factor(R-Work) 0.1816
    R-Factor(R-Free) 0.1971
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 13.36
    f_plane_restr 0.005
    f_chiral_restr 0.06
    f_angle_d 0.886
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3400
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 292
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CrystalClear
    Data Reduction (intensity integration) d*TREK
    Data Reduction (data scaling) d*TREK
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    data collection CrystalClear