POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
3UL0
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 293.0
    Details 0.7M sodium citrate, 10mM DTT, 0.1M HEPES, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 78.69 α = 90
    b = 89.9 β = 90
    c = 99.79 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RIGAKU SATURN 944
    Collection Date 2009-11-16
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU FR-E+ SUPERBRIGHT
    Wavelength List 1.5419
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2
    Resolution(Low) 40.98
    Number Reflections(Observed) 48448
    Percent Possible(Observed) 99.0
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.07
    Percent Possible(All) 99.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.0
    Resolution(Low) 40.983
    Number of Reflections(all) 48448
    Number of Reflections(Observed) 46290
    Number of Reflections(R-Free) 2348
    Percent Reflections(Observed) 95.43
    R-Factor(Observed) 0.1886
    R-Work 0.1875
    R-Free 0.2078
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 36.6675
    Anisotropic B[1][1] -1.3823
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -4.8204
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 6.2027
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0
    Shell Resolution(Low) 2.0408
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 2421
    R-Factor(R-Work) 0.2381
    R-Factor(R-Free) 0.3232
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0408
    Shell Resolution(Low) 2.0852
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2452
    R-Factor(R-Work) 0.2266
    R-Factor(R-Free) 0.2349
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0852
    Shell Resolution(Low) 2.1337
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2482
    R-Factor(R-Work) 0.2074
    R-Factor(R-Free) 0.2992
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1337
    Shell Resolution(Low) 2.1871
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2454
    R-Factor(R-Work) 0.2065
    R-Factor(R-Free) 0.2524
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1871
    Shell Resolution(Low) 2.2462
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2481
    R-Factor(R-Work) 0.1975
    R-Factor(R-Free) 0.2491
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2462
    Shell Resolution(Low) 2.3123
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2504
    R-Factor(R-Work) 0.1897
    R-Factor(R-Free) 0.2091
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3123
    Shell Resolution(Low) 2.3869
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2529
    R-Factor(R-Work) 0.1972
    R-Factor(R-Free) 0.2257
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3869
    Shell Resolution(Low) 2.4722
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2518
    R-Factor(R-Work) 0.2018
    R-Factor(R-Free) 0.2409
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4722
    Shell Resolution(Low) 2.5712
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2539
    R-Factor(R-Work) 0.2114
    R-Factor(R-Free) 0.2341
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5712
    Shell Resolution(Low) 2.6882
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2616
    R-Factor(R-Work) 0.2183
    R-Factor(R-Free) 0.2339
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6882
    Shell Resolution(Low) 2.8299
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.1974
    R-Factor(R-Free) 0.2262
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8299
    Shell Resolution(Low) 3.0071
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2630
    R-Factor(R-Work) 0.2032
    R-Factor(R-Free) 0.2307
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0071
    Shell Resolution(Low) 3.2392
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.1944
    R-Factor(R-Free) 0.2354
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2392
    Shell Resolution(Low) 3.565
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2719
    R-Factor(R-Work) 0.1894
    R-Factor(R-Free) 0.2029
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.565
    Shell Resolution(Low) 4.0805
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.1612
    R-Factor(R-Free) 0.1661
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0805
    Shell Resolution(Low) 5.1394
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2739
    R-Factor(R-Work) 0.1516
    R-Factor(R-Free) 0.1681
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1394
    Shell Resolution(Low) 40.992
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2862
    R-Factor(R-Work) 0.1862
    R-Factor(R-Free) 0.1918
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 14.319
    f_plane_restr 0.005
    f_chiral_restr 0.065
    f_angle_d 0.966
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3438
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 330
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CrystalClear
    Data Reduction (intensity integration) d*TREK
    Data Reduction (data scaling) d*TREK
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    data collection CrystalClear