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X-RAY DIFFRACTION
Materials and Methods page
3UKZ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 293.0
    Details 0.82M sodium citrate, 10mM DTT, 0.1M HEPES, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 78.94 α = 90
    b = 90.02 β = 90
    c = 100.5 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2009-07-23
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type AUSTRALIAN SYNCHROTRON BEAMLINE MX1
    Wavelength List 0.953693
    Site AUSTRALIAN SYNCHROTRON
    Beamline MX1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.3
    Resolution(Low) 44.99
    Number Reflections(Observed) 32538
    Percent Possible(Observed) 72.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.3
    Resolution(Low) 42.39
    Number of Reflections(Observed) 31818
    Number of Reflections(R-Free) 1603
    Percent Reflections(Observed) 97.95
    R-Factor(Observed) 0.1778
    R-Work 0.1763
    R-Free 0.208
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 27.8817
    Anisotropic B[1][1] -0.7519
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -2.6499
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.4018
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3001
    Shell Resolution(Low) 2.3744
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2626
    R-Factor(R-Work) 0.2193
    R-Factor(R-Free) 0.2882
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3744
    Shell Resolution(Low) 2.4592
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2644
    R-Factor(R-Work) 0.1963
    R-Factor(R-Free) 0.2411
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4592
    Shell Resolution(Low) 2.5577
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.1789
    R-Factor(R-Free) 0.2179
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5577
    Shell Resolution(Low) 2.674
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.1715
    R-Factor(R-Free) 0.2279
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.674
    Shell Resolution(Low) 2.815
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2734
    R-Factor(R-Work) 0.1749
    R-Factor(R-Free) 0.2074
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.815
    Shell Resolution(Low) 2.9913
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2757
    R-Factor(R-Work) 0.1708
    R-Factor(R-Free) 0.219
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9913
    Shell Resolution(Low) 3.2222
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2754
    R-Factor(R-Work) 0.175
    R-Factor(R-Free) 0.2232
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2222
    Shell Resolution(Low) 3.5463
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2794
    R-Factor(R-Work) 0.1761
    R-Factor(R-Free) 0.2034
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5463
    Shell Resolution(Low) 4.0591
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2739
    R-Factor(R-Work) 0.1759
    R-Factor(R-Free) 0.1954
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0591
    Shell Resolution(Low) 5.1127
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2856
    R-Factor(R-Work) 0.1484
    R-Factor(R-Free) 0.1584
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1127
    Shell Resolution(Low) 42.397
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2968
    R-Factor(R-Work) 0.1902
    R-Factor(R-Free) 0.2108
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 13.401
    f_plane_restr 0.004
    f_chiral_restr 0.052
    f_angle_d 0.784
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3448
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 307
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Blu-Ice
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    data collection Blu-Ice