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X-RAY DIFFRACTION
Materials and Methods page
3UKY
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 293.0
    Details 0.8M sodium citrate, 10mM DTT, 0.1M HEPES, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 78.19 α = 90
    b = 89.75 β = 90
    c = 98.51 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2009-07-23
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type AUSTRALIAN SYNCHROTRON BEAMLINE MX1
    Wavelength List 0.953693
    Site AUSTRALIAN SYNCHROTRON
    Beamline MX1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.35
    Resolution(Low) 50.57
    Number Reflections(Observed) 29432
    Percent Possible(Observed) 68.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.35
    Resolution(Low) 43.18
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 28351
    Number of Reflections(R-Free) 1437
    Percent Reflections(Observed) 95.96
    R-Factor(Observed) 0.1894
    R-Work 0.188
    R-Free 0.2152
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 38.6603
    Anisotropic B[1][1] -0.6669
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -6.3126
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 6.9795
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.35
    Shell Resolution(Low) 2.434
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2392
    R-Factor(R-Work) 0.2502
    R-Factor(R-Free) 0.2592
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.434
    Shell Resolution(Low) 2.5314
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2510
    R-Factor(R-Work) 0.2545
    R-Factor(R-Free) 0.3295
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5314
    Shell Resolution(Low) 2.6466
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2560
    R-Factor(R-Work) 0.2408
    R-Factor(R-Free) 0.305
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6466
    Shell Resolution(Low) 2.7861
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2605
    R-Factor(R-Work) 0.2237
    R-Factor(R-Free) 0.2714
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7861
    Shell Resolution(Low) 2.9607
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.2008
    R-Factor(R-Free) 0.2405
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9607
    Shell Resolution(Low) 3.1892
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2743
    R-Factor(R-Work) 0.1971
    R-Factor(R-Free) 0.2243
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1892
    Shell Resolution(Low) 3.51
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2770
    R-Factor(R-Work) 0.1956
    R-Factor(R-Free) 0.2108
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.51
    Shell Resolution(Low) 4.0176
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2790
    R-Factor(R-Work) 0.1694
    R-Factor(R-Free) 0.1883
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0176
    Shell Resolution(Low) 5.0605
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2847
    R-Factor(R-Work) 0.1437
    R-Factor(R-Free) 0.1638
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0605
    Shell Resolution(Low) 43.1868
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2975
    R-Factor(R-Work) 0.174
    R-Factor(R-Free) 0.1893
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.439
    f_plane_restr 0.003
    f_chiral_restr 0.043
    f_angle_d 0.596
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3378
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 212
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Blu-Ice
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    data collection Blu-Ice