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X-RAY DIFFRACTION
Materials and Methods page
3UGP
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 295.0
    Details 5% PEG8000, 20% PEG300, 10% glycerol, 0.15% mellitic acid, 100 mM Tris, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 86 α = 90
    b = 86 β = 90
    c = 105.86 γ = 90
     
    Space Group
    Space Group Name:    P 4 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 77
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2009-08-09
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Wavelength 0.97918
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.7
    Resolution(Low) 30
    Number Reflections(Observed) 11450
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.105
    Redundancy 8.8
     
    High Resolution Shell Details
    Resolution(High) 2.697
    Resolution(Low) 2.8
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.52
    Mean I Over Sigma(Observed) 6.77
    R-Sym I(Observed) 0.52
    Redundancy 9.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.697
    Resolution(Low) 29.22
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 11419
    Number of Reflections(R-Free) 546
    Percent Reflections(Observed) 99.3
    R-Factor(Observed) 0.198
    R-Work 0.196
    R-Free 0.238
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -9.7219
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -9.7219
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 19.4438
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.697
    Shell Resolution(Low) 2.9679
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.2261
    R-Factor(R-Free) 0.2995
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9679
    Shell Resolution(Low) 3.3968
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.2083
    R-Factor(R-Free) 0.2532
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3968
    Shell Resolution(Low) 4.2775
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.1693
    R-Factor(R-Free) 0.211
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2775
    Shell Resolution(Low) 29.2261
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2868
    R-Factor(R-Work) 0.1891
    R-Factor(R-Free) 0.2199
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.12
    f_dihedral_angle_d 21.707
    f_angle_d 1.425
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1449
    Nucleic Acid Atoms 318
    Heterogen Atoms 5
    Solvent Atoms 39
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (PHENIX.REFINE: 1.5_2)
    Structure Refinement PHENIX (PHENIX.REFINE: 1.5_2)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.5_2)
    model building PHENIX version: (PHENIX.REFINE: 1.5_2)