X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.5
Temperature 295.0
Details 5% PEG8000, 20% PEG300, 10% glycerol, 0.15% mellitic acid, 100 mM Tris, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 295K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 86 α = 90
b = 86 β = 90
c = 105.86 γ = 90
Symmetry
Space Group P 4 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 77
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2009-08-09
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E -- APS 24-ID-E

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 30 99.8 0.105 0.105 -- 8.8 -- 11450 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.697 2.8 100.0 0.52 0.52 6.77 9.2 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.697 29.22 -- 1.34 -- 11419 546 99.3 -- 0.198 0.196 0.238 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.697 2.9679 -- 138 2639 0.2261 0.2995 -- 99.0
X Ray Diffraction 2.9679 3.3968 -- 128 2654 0.2083 0.2532 -- 99.0
X Ray Diffraction 3.3968 4.2775 -- 140 2712 0.1693 0.211 -- 100.0
X Ray Diffraction 4.2775 29.2261 -- 140 2868 0.1891 0.2199 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -9.7219
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -9.7219
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 19.4438
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.12
f_dihedral_angle_d 21.707
f_angle_d 1.425
f_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1449
Nucleic Acid Atoms 318
Heterogen Atoms 5
Solvent Atoms 39

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHENIX (PHENIX.REFINE: 1.5_2) Structure Solution
PHENIX (PHENIX.REFINE: 1.5_2) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE: 1.5_2) refinement
PHENIX version: (PHENIX.REFINE: 1.5_2) model building