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X-RAY DIFFRACTION
Materials and Methods page
3UGO
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 295.0
    Details 5% PEG8000, 20% PEG300, 10% glycerol, 0.15% mellitic acid, 100 mM Tris, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 86.13 α = 90
    b = 86.13 β = 90
    c = 111.73 γ = 90
     
    Space Group
    Space Group Name:    P 4 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 77
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2009-07-24
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.08090
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Resolution(High) 2.1
    Resolution(Low) 25
    Number Reflections(All) 25331
    Number Reflections(Observed) 25306
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.094
    Redundancy 8.2
     
    High Resolution Shell Details
    Resolution(High) 2.096
    Resolution(Low) 2.18
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.712
    Mean I Over Sigma(Observed) 4.04
    R-Sym I(Observed) 0.712
    Redundancy 8.1
    Number Unique Reflections(All) 2471
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.096
    Resolution(Low) 24.483
    Cut-off Sigma(F) 1.33
    Number of Reflections(Observed) 25306
    Number of Reflections(R-Free) 1318
    Percent Reflections(Observed) 99.79
    R-Factor(Observed) 0.1982
    R-Work 0.1961
    R-Free 0.2366
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -11.4827
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -11.4827
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 23.1439
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.096
    Shell Resolution(Low) 2.1803
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2574
    R-Factor(R-Work) 0.2815
    R-Factor(R-Free) 0.3169
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1803
    Shell Resolution(Low) 2.2795
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2603
    R-Factor(R-Work) 0.232
    R-Factor(R-Free) 0.2505
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2795
    Shell Resolution(Low) 2.3996
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.2022
    R-Factor(R-Free) 0.2451
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3996
    Shell Resolution(Low) 2.5498
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2629
    R-Factor(R-Work) 0.1999
    R-Factor(R-Free) 0.2195
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5498
    Shell Resolution(Low) 2.7464
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2644
    R-Factor(R-Work) 0.1991
    R-Factor(R-Free) 0.2548
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7464
    Shell Resolution(Low) 3.0223
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2625
    R-Factor(R-Work) 0.2135
    R-Factor(R-Free) 0.2495
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0223
    Shell Resolution(Low) 3.4586
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2682
    R-Factor(R-Work) 0.1959
    R-Factor(R-Free) 0.2285
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4586
    Shell Resolution(Low) 4.3535
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2715
    R-Factor(R-Work) 0.1668
    R-Factor(R-Free) 0.2046
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3535
    Shell Resolution(Low) 24.4845
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2880
    R-Factor(R-Work) 0.19
    R-Factor(R-Free) 0.2381
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.056
    f_dihedral_angle_d 19.478
    f_angle_d 1.121
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1456
    Nucleic Acid Atoms 313
    Heterogen Atoms 5
    Solvent Atoms 131
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHASER
    data collection CBASS