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X-RAY DIFFRACTION
Materials and Methods page
3UFF
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.2
    Temperature 293.0
    Details 20% PEG 3350 in 0.2 M ammonium sulfate and 25 mM HEPES pH 7.2. , VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 44.2 α = 90
    b = 32.33 β = 93.66
    c = 49.82 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2004-04-27
     
    Diffraction Radiation
    Monochromator SI(111) CHANNEL CULT MONOCHROMATER
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X6A
    Wavelength List 1.0
    Site NSLS
    Beamline X6A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 4.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.3
    Resolution(Low) 10
    Number Reflections(All) 32040
    Number Reflections(Observed) 31751
    Percent Possible(Observed) 91.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.3
    Resolution(Low) 9.944
    Cut-off Sigma(F) 0.04
    Number of Reflections(all) 32040
    Number of Reflections(Observed) 31751
    Number of Reflections(R-Free) 1465
    Percent Reflections(Observed) 91.3
    R-Factor(All) 0.1518
    R-Factor(Observed) 0.1518
    R-Work 0.1504
    R-Free 0.182
    R-Free Selection Details 10%
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.6905
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.415
    Anisotropic B[2][2] -0.76
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.4505
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3
    Shell Resolution(Low) 1.3464
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2791
    R-Factor(R-Work) 0.2119
    R-Factor(R-Free) 0.2693
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3464
    Shell Resolution(Low) 1.4001
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2834
    R-Factor(R-Work) 0.1619
    R-Factor(R-Free) 0.1802
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4001
    Shell Resolution(Low) 1.4637
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2934
    R-Factor(R-Work) 0.1422
    R-Factor(R-Free) 0.1837
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4637
    Shell Resolution(Low) 1.5406
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2971
    R-Factor(R-Work) 0.1287
    R-Factor(R-Free) 0.163
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5406
    Shell Resolution(Low) 1.6367
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3016
    R-Factor(R-Work) 0.1187
    R-Factor(R-Free) 0.1664
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6367
    Shell Resolution(Low) 1.7624
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3089
    R-Factor(R-Work) 0.1218
    R-Factor(R-Free) 0.1507
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7624
    Shell Resolution(Low) 1.9386
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 3026
    R-Factor(R-Work) 0.1283
    R-Factor(R-Free) 0.159
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9386
    Shell Resolution(Low) 2.2164
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 3205
    R-Factor(R-Work) 0.1423
    R-Factor(R-Free) 0.1781
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2164
    Shell Resolution(Low) 2.7823
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 3215
    R-Factor(R-Work) 0.1564
    R-Factor(R-Free) 0.1713
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7823
    Shell Resolution(Low) 9.9448
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 3205
    R-Factor(R-Work) 0.1699
    R-Factor(R-Free) 0.2068
    Percent Reflections(Observed) 94.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.075
    f_dihedral_angle_d 12.442
    f_angle_d 1.082
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1014
    Nucleic Acid Atoms 0
    Heterogen Atoms 34
    Solvent Atoms 239
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution AutoMR
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building AutoMR
    data collection ADSC version: Quantum