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X-RAY DIFFRACTION
Materials and Methods page
3UEJ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.2
    Temperature 293.0
    Details 20% PEG 3350 in 0.2 M ammonium sulfate and 25 mM HEPES pH 7.2. , VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 43.6 α = 90
    b = 32.47 β = 94.1
    c = 49.97 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
    Diffrn ID 2
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2004-04-22
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2004-04-27
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
    Monochromator SI(111) CHANNEL CULT MONOCHROMAT
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 8-BM
    Wavelength List 0.979
    Site APS
    Beamline 8-BM
    Source SYNCHROTRON
    Type NSLS BEAMLINE X6A
    Wavelength List 1.0
    Site NSLS
    Beamline X6A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 4.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.3
    Resolution(Low) 30
    Number Reflections(All) 42420
    Number Reflections(Observed) 34350
    Percent Possible(Observed) 95.87
    R Merge I(Observed) 0.1
    Redundancy 4.3
     
    High Resolution Shell Details
    Resolution(High) 1.35
    Resolution(Low) 1.42
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.301
    Resolution(Low) 9.983
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 42420
    Number of Reflections(Observed) 33058
    Number of Reflections(R-Free) 1921
    Percent Reflections(Observed) 95.87
    R-Factor(Observed) 0.1433
    R-Work 0.1424
    R-Free 0.1582
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.6885
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.9309
    Anisotropic B[2][2] -2.4434
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.7549
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.301
    Shell Resolution(Low) 1.3334
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2014
    R-Factor(R-Work) 0.2117
    R-Factor(R-Free) 0.2557
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3334
    Shell Resolution(Low) 1.3694
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2104
    R-Factor(R-Work) 0.1761
    R-Factor(R-Free) 0.2206
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3694
    Shell Resolution(Low) 1.4095
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2096
    R-Factor(R-Work) 0.1538
    R-Factor(R-Free) 0.1948
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4095
    Shell Resolution(Low) 1.4549
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2170
    R-Factor(R-Work) 0.1367
    R-Factor(R-Free) 0.1586
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4549
    Shell Resolution(Low) 1.5067
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2182
    R-Factor(R-Work) 0.112
    R-Factor(R-Free) 0.1571
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5067
    Shell Resolution(Low) 1.5668
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2225
    R-Factor(R-Work) 0.1094
    R-Factor(R-Free) 0.1294
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5668
    Shell Resolution(Low) 1.6379
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2242
    R-Factor(R-Work) 0.1061
    R-Factor(R-Free) 0.1274
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6379
    Shell Resolution(Low) 1.7238
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2263
    R-Factor(R-Work) 0.1046
    R-Factor(R-Free) 0.1377
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7238
    Shell Resolution(Low) 1.8312
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2249
    R-Factor(R-Work) 0.111
    R-Factor(R-Free) 0.1282
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8312
    Shell Resolution(Low) 1.9716
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2234
    R-Factor(R-Work) 0.1295
    R-Factor(R-Free) 0.1428
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9716
    Shell Resolution(Low) 2.1681
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2352
    R-Factor(R-Work) 0.1373
    R-Factor(R-Free) 0.153
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1681
    Shell Resolution(Low) 2.4777
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2297
    R-Factor(R-Work) 0.148
    R-Factor(R-Free) 0.1728
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4777
    Shell Resolution(Low) 3.1059
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2315
    R-Factor(R-Work) 0.1635
    R-Factor(R-Free) 0.1685
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1059
    Shell Resolution(Low) 9.9837
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2394
    R-Factor(R-Work) 0.1606
    R-Factor(R-Free) 0.1549
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.085
    f_dihedral_angle_d 13.468
    f_angle_d 1.217
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1024
    Nucleic Acid Atoms 0
    Heterogen Atoms 24
    Solvent Atoms 222
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution AutoMR
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement Phenix version: (phenix.refine: 1.7_650)
    model building AutoMR
    data collection ADSC version: Quantum